In-situ X-ray photoelectron spectroscopy characterization of Si interlayer based surface passivation process for AlGaAs/GaAs quantum wire transistors
Keyword(s):
X Ray
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2006 ◽
Vol 21
(1)
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pp. 112-118
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2001 ◽
Vol 179
(1-4)
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pp. 196-202
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2014 ◽
Vol 85
(6)
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pp. 065109
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