Molecular Surface Analysis and Depth-Profiling of Polyethylene Modified by an Atmospheric Ar-D2O Post-Discharge

2016 ◽  
Vol 13 (11) ◽  
pp. 1106-1119 ◽  
Author(s):  
Vanina Cristaudo ◽  
Stéphanie Collette ◽  
Nunzio Tuccitto ◽  
Claude Poleunis ◽  
Luigi Cesare Melchiorre ◽  
...  
Keyword(s):  
Surface Analysis ◽  
Depth Profiling ◽  
Molecular Surface ◽  
Post Discharge

Surface Analysis and Ultra-Shallow Molecular Depth-Profiling of Polyethylene Treated by an Atmospheric Ar-D2O Post-Discharge

2015 ◽  
Vol 12 (9) ◽  
pp. 919-925 ◽  
Author(s):  
Vanina Cristaudo ◽  
Stéphanie Collette ◽  
Claude Poleunis ◽  
François Reniers ◽  
Arnaud Delcorte
Keyword(s):  
Surface Analysis ◽  
Depth Profiling ◽  
Post Discharge ◽  
Molecular Depth Profiling

Occluded molecular surface: Analysis of protein packing

1995 ◽  
Vol 8 (6) ◽  
pp. 334-344 ◽  
Author(s):  
N. Pattabiraman ◽  
K. B. Ward ◽  
P. J. Fleming
Keyword(s):  
Surface Analysis ◽  
Molecular Surface ◽  
Protein Packing

scholarly journals Surface analysis and depth profiling of corrosion products formed in lead pipes used to supply low alkalinity drinking water

2004 ◽  
Vol 49 (2) ◽  
pp. 49-54 ◽  
Author(s):  
C.M. Davidson ◽  
N.J. Peters ◽  
A. Britton ◽  
L. Brady ◽  
P.H.E. Gardiner ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Surface Analysis ◽  
Corrosion Product ◽  
Distribution System ◽  
Depth Profiling ◽  
Corrosion Products ◽  
Depth Range ◽  
Lead Carbonate ◽  
X Ray ◽  
Calcium Iron

Modern analytical techniques have been applied to investigate the nature of lead pipe corrosion products formed in pH adjusted, orthophosphate-treated, low alkalinity water, under supply conditions. Depth profiling and surface analysis have been carried out on pipe samples obtained from the water distribution system in Glasgow, Scotland, UK. X-ray diffraction spectrometry identified basic lead carbonate, lead oxide and lead phosphate as the principal components. Scanning electron microscopy/energy-dispersive x-ray spectrometry revealed the crystalline structure within the corrosion product and also showed spatial correlations existed between calcium, iron, lead, oxygen and phosphorus. Elemental profiling, conducted by means of secondary ion mass spectrometry (SIMS) and secondary neutrals mass spectrometry (SNMS) indicated that the corrosion product was not uniform with depth. However, no clear stratification was apparent. Indeed, counts obtained for carbonate, phosphate and oxide were well correlated within the depth range probed by SIMS. SNMS showed relationships existed between carbon, calcium, iron, and phosphorus within the bulk of the scale, as well as at the surface. SIMS imaging confirmed the relationship between calcium and lead and suggested there might also be an association between chloride and phosphorus.

Molecular surface analysis by TOF-SIMS

1992 ◽  
Vol 50 (2) ◽  
pp. 1556-1557
Author(s):  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Surface Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Molecular Surface ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Static Conditions ◽  
Primary Ions ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) performs surface sensitive analysis of the elemental and molecular composition of solids. TOFSIMS is a relatively new embodiment of static secondary ion mass spectrometry (SSIMS) in which the dose of primary ions incident on the surface is typically less than 1012 ions/cm2. Since typical solid surfaces have an atomic density of 1015 atoms/cm2, this primary ion dose nominally removes less than 0.1% of a monolayer. Hence, SIMS analyses performed under these static conditions represent near surface analysis in which secondary ions are produced from the top few monolayers of the surface. The actual sampling depth is determined by the primary ion momentum, angle of incidence and chemistry of the surface. Since low dose primary ions cause minimal perturbation of the chemistry of the solid surface, SSIMS analyses often produce molecular or pseudo-molecular ions characteristic of the chemical composition of the surface. Thus, molecular ions or structurally significant fragment ions are often observed in SSIMS analyses of surfaces containing inorganic and organic residues, polymers surfaces, coatings, and biological materials such as tissues and membranes.

Depth profiling by ARXPS in surface analysis

1995 ◽  
Vol 353 (3-4) ◽  
pp. 473-477 ◽  
Author(s):  
H. Fischer ◽  
R. Svagera ◽  
H. Ebel ◽  
M. F. Ebel ◽  
B. Scho�mann
Keyword(s):  
Surface Analysis ◽  
Depth Profiling
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