Errors induced in quartz crystal mass uptake measurements by nongravimetric effects: Considerations beyond the EerNisse caution

2006 ◽  
Vol 44 (5) ◽  
pp. 801-814 ◽  
Author(s):  
Lameck Banda ◽  
Mataz Alcoutlabi ◽  
Gregory B. McKenna
Keyword(s):  
Quartz Crystal ◽  
Mass Uptake ◽  
Crystal Mass

ChemInform Abstract: Determination of the Hydrogen Content in Amorphous LaNi, Films Using a Quartz- Crystal Mass-Monitoring Method.

1986 ◽  
Vol 17 (13) ◽  
Author(s):  
H. SAKAGUCHI ◽  
N. TANIGUCHI ◽  
H. NAGAI ◽  
K. NIKI ◽  
G. ADACHI ◽  
...  
Keyword(s):  
Hydrogen Content ◽  
Quartz Crystal ◽  
Monitoring Method ◽  
Crystal Mass

The Piezoelectric Quartz Crystal Mass and Dissipation Sensor:  A Means of Studying Cell Adhesion

Langmuir ◽  
1998 ◽  
Vol 14 (2) ◽  
pp. 248-251 ◽  
Author(s):  
C. Fredriksson ◽  
S. Kihlman ◽  
M. Rodahl ◽  
B. Kasemo
Keyword(s):  
Cell Adhesion ◽  
Quartz Crystal ◽  
Piezoelectric Quartz ◽  
Piezoelectric Quartz Crystal ◽  
Crystal Mass

Quartz-crystal mass sensors with glued foil electrodes

1996 ◽  
Vol 37 (1-2) ◽  
pp. 91-95 ◽  
Author(s):  
R.V Bucur ◽  
J.-O Carlsson ◽  
V.M Mecea
Keyword(s):  
Quartz Crystal ◽  
Mass Sensors ◽  
Crystal Mass

Nanogravimetric Evaluation of Hydrogen Uptake in Thin Film Materials by A Quartz Crystal Microbalance

2008 ◽  
Vol 1098 ◽  
Author(s):  
Tao Xu
Keyword(s):  
Thin Film ◽  
Hydrogen Storage ◽  
Frequency Shift ◽  
Quartz Crystal Microbalance ◽  
Quartz Crystal ◽  
Hydrogen Gas ◽  
Hydrogen Storage Materials ◽  
Storage Materials ◽  
Mass Uptake ◽  
Hydrogen Mass

AbstractTo study the hydrogen storage materials in their thin film format provides a unique approach to investigate many interfacial phenomena associated with current research on hydrogen storage materials. However, the challenge is to establish a reliable method to measure weight change of at least a few tens of nanograms in pressurized hydrogen gas. We demonstrate the application of a quartz crystal microbalance for direct mass-metric evaluation of hydrogen storage materials in the pressure range of 0˜40 bars. The frequency shift of a quartz crystal coated with hydrogen absorbing materials is affected by the hydrogen mass uptake on the crystal, the pressure and the viscosity of the gases, and the crystal surface roughness, of which the roughness contribution has no direct analytical expression. Through a control experiment on the same crystal in helium, the roughness contribution in hydrogen can be derived and the frequency shift due to the hydrogen mass uptake is obtained.

Determination of the hydrogen content in amorphous lanthanum-nickel (LaNi5) films using a quartz-crystal mass-monitoring method

1985 ◽  
Vol 89 (25) ◽  
pp. 5550-5552 ◽  
Author(s):  
H. Sakaguchi ◽  
N. Taniguchi ◽  
H. Nagai ◽  
G. Niki ◽  
G. Adachi ◽  
...  
Keyword(s):  
Hydrogen Content ◽  
Quartz Crystal ◽  
Monitoring Method ◽  
Lanthanum Nickel ◽  
Crystal Mass

Hole Formation in Gold Films

1972 ◽  
Vol 30 ◽  
pp. 510-511
Author(s):  
R. W. Vook ◽  
R. Cook ◽  
R. Ziemer
Keyword(s):  
Deposition Rate ◽  
Quartz Crystal ◽  
Evaporation Rate ◽  
Gold Films ◽  
Hole Density ◽  
Hole Formation ◽  
Microscope Slide ◽  
Crystal Film ◽  
Glass Microscope Slide ◽  
Glass Microscope

During recent experiments on Au films, a qualitative correlation between hole formation and deposition rate was observed. These early studies were concerned with films 80 to 1000A thick deposited on glass at -185°C and annealed at 170°C. In the present studies this earlier work was made quantitative. Deposition rates varying between 5 and 700 A/min were used. The effects of deposition rate on hole density for two films 300 and 700A thick were investigated.Au was evaporated from an outgassed W filament located 10 cm from a glass microscope slide substrate and a quartz crystal film thickness monitor. A shutter separating the filament from the substrate and monitor made it possible to obtain a constant evaporation rate before initiating deposition. The pressure was reduced to less than 1 x 10-6 torr prior to cooling the substrate with liquid nitrogen. The substrate was cooled in 15 minutes during which the pressure continued to drop to the mid 10-7 torr range, where deposition was begun.

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