Characterization of epoxy resin (SU-8) film using thickness-shear mode (TSM) resonator under various conditions

Jeanne Hossenlopp; Lizhong Jiang; Richard Cernosek; Fabien Josse

doi:10.1002/polb.20111

Characterization of epoxy resin (SU-8) film using thickness-shear mode (TSM) resonator under various conditions

Journal of Polymer Science Part B Polymer Physics ◽

10.1002/polb.20111 ◽

2004 ◽

Vol 42 (12) ◽

pp. 2373-2384 ◽

Cited By ~ 36

Author(s):

Jeanne Hossenlopp ◽

Lizhong Jiang ◽

Richard Cernosek ◽

Fabien Josse

Keyword(s):

Epoxy Resin ◽

Shear Mode ◽

Thickness Shear Mode ◽

Thickness Shear

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Characterization of epoxy resin SU-8 film using thickness-shear mode (TSM) resonator

IEEE International Frequency Control Sympposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 ◽

10.1109/freq.2003.1275225 ◽

2004 ◽

Cited By ~ 4

Author(s):

Lizhong Jiang ◽

J. Hossenlopp ◽

R. Cemosek ◽

F. Josse

Keyword(s):

Epoxy Resin ◽

Shear Mode ◽

Thickness Shear Mode ◽

Thickness Shear

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Characterization of Extracellular Matrix (ECM) Produced by MC3T3 Cells Using Thickness Shear Mode (TSM) Resonators

2006 IEEE International Frequency Control Symposium and Exposition ◽

10.1109/freq.2006.275443 ◽

2006 ◽

Cited By ~ 1

Author(s):

Fang Li ◽

Qing-ming Wang ◽

James Wang

Keyword(s):

Extracellular Matrix ◽

Shear Mode ◽

Thickness Shear Mode ◽

Thickness Shear

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Characterization of polymer nanocomposite films using quartz thickness shear mode (TSM) acoustic wave sensor

Sensors and Actuators A Physical ◽

10.1016/j.sna.2006.12.027 ◽

2007 ◽

Vol 136 (1) ◽

pp. 111-117 ◽

Cited By ~ 19

Author(s):

Lifeng Qin ◽

Hongbin Cheng ◽

Jacob M. Li ◽

Qing-Ming Wang

Keyword(s):

Acoustic Wave ◽

Polymer Nanocomposite ◽

Nanocomposite Films ◽

Shear Mode ◽

Thickness Shear Mode ◽

Acoustic Wave Sensor ◽

Thickness Shear

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Characterization of functionally graded elastic materials using a thickness-shear mode quartz resonator

Philosophical Magazine Letters ◽

10.1080/09500839.2013.784400 ◽

2013 ◽

Vol 93 (6) ◽

pp. 362-370 ◽

Cited By ~ 6

Author(s):

Yangyang Chen ◽

Ji Wang ◽

Jianke Du ◽

Jiashi Yang

Keyword(s):

Quartz Resonator ◽

Functionally Graded ◽

Shear Mode ◽

Elastic Materials ◽

Thickness Shear Mode ◽

Thickness Shear

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A multi-resonance thickness-shear mode (MTSM) measurement technique for quantitative characterization of biological interfacial processes

10.17918/etd-3198 ◽

2021 ◽

Author(s):

Ertan Ergezen

Keyword(s):

Measurement Technique ◽

Shear Mode ◽

Quantitative Characterization ◽

Thickness Shear Mode ◽

Interfacial Processes ◽

Thickness Shear

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Characterization of Parylene-C using quartz thickness shear mode (TSM) resonators

2013 Joint European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC) ◽

10.1109/eftf-ifc.2013.6702223 ◽

2013 ◽

Author(s):

Huiyan Wu ◽

Hongfei Zu ◽

Xiaotian Li ◽

Qing-Ming Wang

Keyword(s):

Shear Mode ◽

Parylene C ◽

Thickness Shear Mode ◽

Thickness Shear

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Characterization of a thickness‐shear mode quartz resonator with multiple nonpiezoelectric layers

Journal of Applied Physics ◽

10.1063/1.356410 ◽

1994 ◽

Vol 75 (3) ◽

pp. 1319-1329 ◽

Cited By ~ 164

Author(s):

Victoria Edwards Granstaff ◽

Stephen J. Martin

Keyword(s):

Quartz Resonator ◽

Shear Mode ◽

Thickness Shear Mode ◽

Thickness Shear

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Design, manufacturing, and characterization of high-frequency thickness-shear mode resonators

Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052) ◽

10.1109/freq.2000.887338 ◽

2002 ◽

Cited By ~ 12

Author(s):

J. Rabe ◽

S. Buttgenbach ◽

B. Zimmermann ◽

P. Hauptmann

Keyword(s):

High Frequency ◽

Shear Mode ◽

Thickness Shear Mode ◽

Thickness Shear

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Detail specification for glass-encapsulated quartz crystal units for oscillator applications. DA, CY and CZ enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level.

10.3403/00141615u ◽

2015 ◽

Keyword(s):

Quartz Crystal ◽

Shear Mode ◽

Frequency Range ◽

Thickness Shear Mode ◽

Temperature Ranges ◽

Temperature Controlled ◽

Thickness Shear

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Detail specification for glass-encapsulated quartz crystal units for oscillator applications. DA, CY and CZ enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level.

10.3403/00141615 ◽

1975 ◽

Keyword(s):

Quartz Crystal ◽

Shear Mode ◽

Frequency Range ◽

Thickness Shear Mode ◽

Temperature Ranges ◽

Temperature Controlled ◽

Thickness Shear

Download Full-text