scholarly journals Resistive loading of photovoltaic modules and arrays for long-term exposure testing

2006 ◽  
Vol 14 (6) ◽  
pp. 567-575 ◽  
Author(s):  
C. R. Osterwald ◽  
J. Adelstein ◽  
J. A. del Cueto ◽  
W. Sekulic ◽  
D. Trudell ◽  
...  
Solar Energy ◽  
2017 ◽  
Vol 157 ◽  
pp. 587-595 ◽  
Author(s):  
Ali Tahri ◽  
Santiago Silvestre ◽  
Fatima Tahri ◽  
Soumia Benlebna ◽  
Aissa Chouder

Energies ◽  
2020 ◽  
Vol 13 (16) ◽  
pp. 4126
Author(s):  
Gilbert Osayemwenre ◽  
Edson Meyer

This work examines the degradation of photovoltaic modules. It assesses the structural defects of amorphous silicon solar cells, which result from mechanical stress at nanoscale level. Firstly, it analyses the interface morphology, deformation, and internal delamination of a single junction amorphous silicon solar module. Secondly, it explores the interface deformation of the layers of the defective region of the module with some statistical tools including root mean root (RSM) and arithmetic mean (Rq). It used the aforementioned tools to demonstrate the effect of microstructural defects on the mechanical behaviour of the entire layers of the module. The study established that the defect observed in the module, emanated from long-term degradation of the a-Si solar cells after years of exposure to various light and temperature conditions. It tested the mechanism of mechanical degradation and its effect on the reliability and stability of the defective and non-defective regions of the module with adhesion force characterisation.


Data in Brief ◽  
2016 ◽  
Vol 7 ◽  
pp. 366-371 ◽  
Author(s):  
Sofiane Kichou ◽  
Santiago Silvestre ◽  
Gustavo Nofuentes ◽  
Miguel Torres-Ramírez ◽  
Aissa Chouder ◽  
...  

2017 ◽  
Vol 56 (8S2) ◽  
pp. 08MD02 ◽  
Author(s):  
Jessica Nover ◽  
Renate Zapf-Gottwick ◽  
Carolin Feifel ◽  
Michael Koch ◽  
Jörg W. Metzger ◽  
...  
Keyword(s):  

2000 ◽  
Vol 609 ◽  
Author(s):  
Bolko von Roedern ◽  
Joseph A. del Cueto

ABSTRACTLong-term light-soaking experiments of amorphous silicon photovoltaic modules have now established that stabilization of the degradation occurs at levels that depend significantly on the operating conditions, as well as on the operating history of the modules. We suggest that stabilization occurs because of the introduction of degradation mechanisms with different time constants and annealing activation energies, depending on the exposure conditions. Stabilization will occur once a sufficient accumulation of different degradation mechanisms occurs. We find that operating module temperature during light-soaking is the most important parameter for determining stabilized performance. Next in importance is the exposure history of the device. The precise value of the light intensity seems least important in determining the stabilized efficiency, as long as its level is a significant fraction of 1-sun.


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