A path towards a better characterisation of silicon thin-film solar cells: depth profile analysis by pulsed radiofrequency glow discharge optical emission spectrometry

Pascal Sanchez; Beatriz Fernández; Armando Menéndez; David Gómez; Rosario Pereiro; Alfredo Sanz-Medel

doi:10.1002/pip.2387

A path towards a better characterisation of silicon thin-film solar cells: depth profile analysis by pulsed radiofrequency glow discharge optical emission spectrometry

Progress in Photovoltaics Research and Applications ◽

10.1002/pip.2387 ◽

2013 ◽

Vol 22 (12) ◽

pp. 1246-1255 ◽

Cited By ~ 10

Author(s):

Pascal Sanchez ◽

Beatriz Fernández ◽

Armando Menéndez ◽

David Gómez ◽

Rosario Pereiro ◽

...

Keyword(s):

Thin Film ◽

Glow Discharge ◽

Profile Analysis ◽

Optical Emission ◽

Thin Film Solar Cells ◽

Emission Spectrometry ◽

Pulsed Radiofrequency ◽

Depth Profile Analysis ◽

Silicon Thin Film ◽

Radiofrequency Glow Discharge

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Depth Profile Analysis of Amorphous Silicon Thin Film Solar Cells by Pulsed Radiofrequency Glow Discharge Time of Flight Mass Spectrometry

Journal of the American Society for Mass Spectrometry ◽

10.1007/s13361-014-1022-9 ◽

2014 ◽

Vol 26 (2) ◽

pp. 305-314 ◽

Cited By ~ 7

Author(s):

Aitor Alvarez-Toral ◽

Pascal Sanchez ◽

Armando Menéndez ◽

Rosario Pereiro ◽

Alfredo Sanz-Medel ◽

...

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Profile Analysis ◽

Thin Film Solar Cells ◽

Pulsed Radiofrequency ◽

Depth Profile Analysis ◽

Discharge Time ◽

Silicon Thin Film ◽

Flight Mass Spectrometry ◽

Radiofrequency Glow Discharge

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Analytical performance of pulsed radiofrequency glow discharge optical emission spectrometry for bulk and in-depth profile analysis of conductors and insulators

Journal of Analytical Atomic Spectrometry ◽

10.1039/c0ja00094a ◽

2011 ◽

Vol 26 (4) ◽

pp. 776-783 ◽

Cited By ~ 10

Author(s):

Deborah Alberts ◽

Beatriz Fernández ◽

Rosario Pereiro ◽

Alfredo Sanz-Medel

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Analytical Performance ◽

Emission Spectrometry ◽

Pulsed Radiofrequency ◽

Depth Profile Analysis ◽

Radiofrequency Glow Discharge

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Quantitative depth profile analysis of metallic coatings by pulsed radiofrequency glow discharge optical emission spectrometry

Analytica Chimica Acta ◽

10.1016/j.aca.2010.10.039 ◽

2011 ◽

Vol 684 (1-2) ◽

pp. 47-53 ◽

Cited By ~ 11

Author(s):

Pascal Sánchez ◽

Beatriz Fernández ◽

Armando Menéndez ◽

Jaime Orejas ◽

Rosario Pereiro ◽

...

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Pulsed Radiofrequency ◽

Metallic Coatings ◽

Depth Profile Analysis ◽

Radiofrequency Glow Discharge

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Pulsed radiofrequency glow discharge optical emission spectrometry for the direct characterisation of photovoltaic thin film silicon solar cells

Journal of Analytical Atomic Spectrometry ◽

10.1039/b923884k ◽

2010 ◽

Vol 25 (3) ◽

pp. 370 ◽

Cited By ~ 20

Author(s):

Pascal Sánchez ◽

Beatriz Fernández ◽

Armando Menéndez ◽

Rosario Pereiro ◽

Alfredo Sanz-Medel

Keyword(s):

Thin Film ◽

Solar Cells ◽

Glow Discharge ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Silicon Solar Cells ◽

Pulsed Radiofrequency ◽

Thin Film Silicon ◽

Radiofrequency Glow Discharge

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In-depth profile analysis of filled alumina and titania nanostructured templates by radiofrequency glow discharge coupled to optical emission spectrometry

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-009-3327-2 ◽

2009 ◽

Vol 396 (8) ◽

pp. 2833-2840 ◽

Cited By ~ 10

Author(s):

D. Alberts ◽

V. Vega ◽

R. Pereiro ◽

N. Bordel ◽

V. M. Prida ◽

...

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

Radiofrequency Glow Discharge

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In-depth profile analysis of oxide films by radiofrequency glow discharge optical emission spectrometry (rf-GD-OES): possibilities of depth-resolved solid-state speciation

Journal of Analytical Atomic Spectrometry ◽

10.1039/b803713b ◽

2008 ◽

Vol 23 (10) ◽

pp. 1378 ◽

Cited By ~ 10

Author(s):

Julien Malherbe ◽

Beatriz Fernández ◽

Hervé Martinez ◽

Patrick Chapon ◽

Peter Panjan ◽

...

Keyword(s):

Solid State ◽

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Oxide Films ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

Radiofrequency Glow Discharge

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In-depth profile analysis of thin films deposited on non-conducting glasses by radiofrequency glow-discharge–optical emission spectrometry

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-005-0123-5 ◽

2005 ◽

Vol 384 (4) ◽

pp. 876-886 ◽

Cited By ~ 9

Author(s):

Beatriz Fernández ◽

Antonio Martín ◽

Nerea Bordel ◽

Rosario Pereiro ◽

Alfredo Sanz-Medel

Keyword(s):

Thin Films ◽

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

Radiofrequency Glow Discharge

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Investigations on the Use of Radiofrequency Glow Discharge Optical Emission Spectrometry for In-depth Profile Analysis of Painted Coatings

Journal of Analytical Atomic Spectrometry ◽

10.1039/a701390f ◽

1997 ◽

Vol 12 (10) ◽

pp. 1209-1214 ◽

Cited By ~ 13

Author(s):

Matilde Fernández ◽

Nerea Bordel ◽

Rosario Pereiro ◽

Alfredo Sanz-medel

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

Radiofrequency Glow Discharge

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In-depth profile analysis by radiofrequency glow discharge optical emission spectrometry using pressure as variable parameter

Journal of Analytical Atomic Spectrometry ◽

10.1039/b010059p ◽

2001 ◽

Vol 16 (4) ◽

pp. 370-375 ◽

Cited By ~ 13

Author(s):

Jorge Pisonero ◽

Covadonga Pérez ◽

Rosario Pereiro ◽

Nerea Bordel ◽

Alfredo Sanz-Medel

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Variable Parameter ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

Radiofrequency Glow Discharge

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In search of the ultimate experiment for quantitative depth profile analysis in glow discharge optical emission spectrometry. Part I: Calibration curves

Surface and Interface Analysis ◽

10.1002/sia.740230102 ◽

1995 ◽

Vol 23 (1) ◽

pp. 1-11 ◽

Cited By ~ 15

Author(s):

Richard Payling ◽

Delwyn G. Jones ◽

Stephen A. Gower

Keyword(s):

Glow Discharge ◽

Depth Profile ◽

Profile Analysis ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Depth Profile Analysis ◽

Calibration Curves

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