On the determination of the emitter saturation current density from lifetime measurements of silicon devices
2012 ◽
pp. n/a-n/a
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2005 ◽
Vol 355
(1-4)
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pp. 408-416
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2013 ◽
Vol 652-654
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pp. 2239-2243
2012 ◽
Vol 106
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pp. 76-79
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2011 ◽
Vol 58
(2)
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pp. 441-447
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2016 ◽
Vol 11
(4)
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pp. 939-942
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2012 ◽
Vol 104
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pp. 121-124
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