Towards ultrathin copper indium gallium diselenide solar cells: proof of concept study by chemical etching and gold back contact engineering

2012 ◽  
Vol 20 (5) ◽  
pp. 582-587 ◽  
Author(s):  
Zacharie Jehl Li-Kao ◽  
Negar Naghavi ◽  
Felix Erfurth ◽  
Jean François Guillemoles ◽  
Isabelle Gérard ◽  
...  
2013 ◽  
Vol 2013 ◽  
pp. 1-9 ◽  
Author(s):  
S. Ouédraogo ◽  
F. Zougmoré ◽  
J. M. Ndjaka

We used a one-dimensional simulation program Solar Cell Capacitance Simulator in 1 Dimension (SCAPS-1D) to investigate Copper-Indium-Gallium-Diselenide- (CIGS-) based solar cells properties. Starting with a conventional ZnO-B/i-ZnO/CdS/CIGS structure, we simulated the parameters of current-voltage characteristics and showed how the absorber layer thickness, hole density, and band gap influence the short-circuit current density (Jsc), open-circuit voltage (Voc), fill factor (FF), and efficiency of solar cell. Our simulation results showed that all electrical parameters are greatly affected by the absorber thickness (w) below 1000 nm, due to the increase of back-contact recombination and very poor absorption. Increasing hole density (p) or absorber band gap (Eg) improvesVocand leads to high efficiency, which equals value of 16.1% whenp= 1016 cm−3andEg=1.2 eV. In order to reduce back-contact recombination, the effect of a very thin layer with high band gap inserted near the back contact and acting as electrons reflector, the so-called back-electron reflector (EBR), has been investigated. The performances of the solar cells are significantly improved, when ultrathin absorbers (w< 500 nm) are used; the corresponding gain ofJscdue to the EBR is 3 mA/cm2. Our results are in good agreement with those reported in the literature from experiments.


2013 ◽  
Vol 103 (14) ◽  
pp. 143904 ◽  
Author(s):  
Manuel Reinhard ◽  
Paul Sonntag ◽  
Ralph Eckstein ◽  
Linda Bürkert ◽  
Andreas Bauer ◽  
...  

2007 ◽  
Vol 91 (9) ◽  
pp. 807-812 ◽  
Author(s):  
Vignesh Gowrishankar ◽  
Christine K. Luscombe ◽  
Michael D. McGehee ◽  
Jean M.J. Fréchet

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