Characterization of polymers in the solid state II: Synchrotron radiation, x-ray scattering and electron microscopy (Advances in Polymer Science, Volume 67). Edited by H. H. Kausch and H. G. Zachmann, Springer- Verlag, Berlin, Heidelberg, New York, Tokyo, 1985. pp. xi+233, price DM 128.00. ISBN 3-540-13780-7

1986 ◽  
Vol 18 (6) ◽  
pp. 399-399
Author(s):  
R. A. Pethrick
Keyword(s):  
Electron Microscopy ◽  
New York ◽  
Solid State ◽  
Synchrotron Radiation ◽  
Science Volume ◽  
Polymer Science ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

Synthesis of Linear Oligomers of (R)-3-Hydroxybutyrate and Solid-State Structural Investigations by electron microscopy and X-ray scattering

1994 ◽  
Vol 77 (4) ◽  
pp. 1099-1123 ◽  
Author(s):  
Dieter Seebach ◽  
H. Michael Bürger ◽  
Hans-Martin Müller ◽  
Urs D. Lengweiler ◽  
Albert K. Beck ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Solid State ◽  
Structural Investigations ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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