Exploring the effect of electron beam irradiation on the properties of some EPDM-flax fiber composites

2017 ◽  
Vol 40 (1) ◽  
pp. 315-327 ◽  
Author(s):  
Maria Daniela Stelescu ◽  
Anton Airinei ◽  
Elena Manaila ◽  
Nicusor Fifere ◽  
Gabriela Craciun ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Fiber Composites ◽  
Flax Fiber ◽  
Beam Irradiation

scholarly journals Dielectric, Thermal and Water Absorption Properties of Some EPDM/Flax Fiber Composites

Polymers ◽  
2021 ◽  
Vol 13 (15) ◽  
pp. 2555
Author(s):  
Anton Airinei ◽  
Mihai Asandulesa ◽  
Maria Daniela Stelescu ◽  
Niţǎ Tudorachi ◽  
Nicusor Fifere ◽  
...  
Keyword(s):  
Water Uptake ◽  
Electron Beam Irradiation ◽  
Degradation Products ◽  
Fiber Composites ◽  
Flax Fiber ◽  
Relaxation Processes ◽  
Ethylene Propylene Diene Monomer ◽  
Beam Irradiation ◽  
Absorption Properties ◽  
Different Doses

This paper deals with the dielectric and sorption properties of some flax fiber-reinforced ethylene-propylene-diene monomer (EPDM) composites containing different fiber loadings as well as their behavior after exposure to different doses of electron beam irradiation. Three relaxation processes were evinced, a weak relaxation β at sub-Tg temperatures and two α-type relaxations above the Tg. The EPDM/flax composites exhibited higher values of dielectric constant, dielectric loss and conductivity as compared to a pristine EPDM sample. Using thermogravimetric analysis (TG) coupled with Fourier transform infrared spectroscopy (FTIR) and mass spectrometry (MS) (TG/FTIR/MS system), the degradation products can be identified. The water uptake increased as the flax fiber level increased in composites. The water uptake tests of irradiated composites showed that the highest water content was obtained for a flax fiber level of 20 phr.

scholarly journals Effect of electron beam irradiation on mechanical properties of gelatin/Brazil nut shell fiber composites

2010 ◽  
Vol 15 (2) ◽  
pp. 380-385 ◽  
Author(s):  
Patrícia Y. Inamura ◽  
Kleber Shimazaki ◽  
Maria Aparecida Colombo ◽  
Ricardo de Rosa ◽  
Esperidiana Augusta Barretos de Moura ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Fiber Composites ◽  
Brazil Nut ◽  
Beam Irradiation

Mechanical properties of bio-fiber composites reinforced with luffa cylindrica irradiated by electron beam

2019 ◽  
Vol 33 (26) ◽  
pp. 1950305 ◽  
Author(s):  
Subhashree Patra ◽  
Kamal Lochan Mohanta ◽  
Chhatrapati Parida
Keyword(s):  
Mechanical Properties ◽  
Electron Beam ◽  
Lactic Acid ◽  
Electron Beam Irradiation ◽  
Natural Fiber ◽  
Waste Product ◽  
Fiber Composites ◽  
Poly Lactic Acid ◽  
Beam Irradiation ◽  
Luffa Cylindrica

This investigation aims to analyze the effects of electron beam irradiation on the morphological and mechanical properties of green composites synthesized using natural fibers of luffa cylindrica (LC) and biodegradable polymer poly (lactic) acid. This work aims to transform the low priced, readily available, agricultural waste product LC fiber into a high value product. The major challenge during the fabrication of natural fiber composites is the chemical bonding between hydrophilic LC fiber and hydrophobic poly lactic acid (PLA) matrix. Due to the disagreeing chemical nature of fiber and matrix, they are not compatible. The fibers are exposed to physical treatment, i.e., electron beam irradiation of different doses 0.5, 1.0, 2.0, 4.0 and 10.0 Gy using 6 MeV medical linear accelerator to increase the compatibility of LC fiber with PLA. Before irradiation, LC fibers are modified with calcium salts to explore the use of composite materials in biomedical terrain. When PLA is reinforced with irradiated LC fiber, tensile strength increases by 79.87% and flexural strength increases by 177%. Mechanical parameters generated by flexural and tensile tests of this study can be explored to have various clinical applications like bone implant, replacement of cervical cavities, etc.

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

A Study of Electron Beam Irradiation Influence on Device Contact Junction Characteristics of Advanced DRAM Using Atomic Force Probing

2013 ◽  
Author(s):  
Wei-Chih Wang ◽  
Jian-Shing Luo
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Forward Bias ◽  
Irradiation Damage ◽  
Beam Irradiation ◽  
Excess Current ◽  
Atomic Force ◽  
Order Of Magnitude ◽  
Voltage Contrast ◽  
Acceleration Voltage

Abstract In this paper, we revealed p+/n-well and n+/p-well junction characteristic changes caused by electron beam (EB) irradiation. Most importantly, we found a device contact side junction characteristic is relatively sensitive to EB irradiation than its whole device characteristic; an order of magnitude excess current appears at low forward bias region after 1kV EB acceleration voltage irradiation (Vacc). Furthermore, these changes were well interpreted by our Monte Carlo simulation results, the Shockley-Read Hall (SRH) model and the Generation-Recombination (G-R) center trap theory. In addition, four essential examining items were suggested and proposed for EB irradiation damage origins investigation and evaluation. Finally, by taking advantage of the excess current phenomenon, a scanning electron microscope (SEM) passive voltage contrast (PVC) fault localization application at n-FET region was also demonstrated.

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