scholarly journals Enhancement in thermoelectric properties using a P-type and N-type thin-film device structure

2013 ◽  
Vol 34 (10) ◽  
pp. 1728-1734 ◽  
Author(s):  
Ling Xu ◽  
Yuchun Liu ◽  
Bingbing Chen ◽  
Chen Zhao ◽  
Kai Lu
2014 ◽  
Vol 2 (18) ◽  
pp. 6456-6462 ◽  
Author(s):  
Joana Loureiro ◽  
Joao R. Santos ◽  
Adriana Nogueira ◽  
Frederic Wyczisk ◽  
Laurent Divay ◽  
...  

This work reports the influence of a Cr layer in boosting the thermoelectric properties of a non-toxic and abundant thermoelectric material, V2O5, deposited as a thin film by thermal evaporation and annealed at 500 °C, reachingZT> 0.1.


2019 ◽  
Vol 49 (1) ◽  
pp. 572-577
Author(s):  
Natchanun Prainetr ◽  
Athorn Vora-ud ◽  
Mati Horprathum ◽  
Pennapa Muthitamongkol ◽  
Somporn Thaowonkaew ◽  
...  

2019 ◽  
Vol 8 (1) ◽  
pp. 422-443 ◽  
Author(s):  
Zong-Wei Shang ◽  
Hsiao-Hsuan Hsu ◽  
Zhi-Wei Zheng ◽  
Chun-Hu Cheng

Abstract Transparent electronics has attracted much attention and been widely studied for next-generation high-performance flat-panel display application in the past few years, because of its excellent electrical properties. In display application, thin film transistors (TFTs) play an important role as the basic units by controlling the pixels. Among them, oxide-based TFTs have become promising candidates and gradually replaced the conventional amorphous and polycrystalline silicon TFTs, due to high mobility, good transparency, excellent uniformity and low processing temperature. Even though n-type oxide TFTs have shown high device performance and been used in commercial display application, p-type oxide TFTs with the equal performance have been rarely reported. Hence, in this paper, recent progress and challenges in p-type oxide-based TFTs are reviewed. After a short introduction, the TFT device structure and operation are presented. Then, recent developments in p-type oxide TFTs are discussed in detail, with the emphasis on the potential p-type oxide candidates as copper oxide, tin oxide and nickel oxide. Moreover, miscellaneous applications of p-type oxide TFTs are also presented. Despite this, the performance of p-type oxide TFTs still lags behind, as compared with that of n-type counterparts. Thus, the current issues and challenges of p-type oxide TFTs are briefly discussed.


2020 ◽  
Vol 91 (3) ◽  
pp. 30201
Author(s):  
Hang Yu ◽  
Jianlin Zhou ◽  
Yuanyuan Hao ◽  
Yao Ni

Organic thin film transistors (OTFTs) based on dioctylbenzothienobenzothiophene (C8BTBT) and copper (Cu) electrodes were fabricated. For improving the electrical performance of the original devices, the different modifications were attempted to insert in three different positions including semiconductor/electrode interface, semiconductor bulk inside and semiconductor/insulator interface. In detail, 4,4′,4′′-tris[3-methylpheny(phenyl)amino] triphenylamine (m-MTDATA) was applied between C8BTBTand Cu electrodes as hole injection layer (HIL). Moreover, the fluorinated copper phthalo-cyanine (F16CuPc) was inserted in C8BTBT/SiO2 interface to form F16CuPc/C8BTBT heterojunction or C8BTBT bulk to form C8BTBT/F16CuPc/C8BTBT sandwich configuration. Our experiment shows that, the sandwich structured OTFTs have a significant performance enhancement when appropriate thickness modification is chosen, comparing with original C8BTBT devices. Then, even the low work function metal Cu was applied, a normal p-type operate-mode C8BTBT-OTFT with mobility as high as 2.56 cm2/Vs has been fabricated.


Author(s):  
Rikushi KATO ◽  
Masanori MATSUSHITA ◽  
Hideyuki TAKAHASHI ◽  
Osamu MORI ◽  
Nobukatsu OKUIZUMI ◽  
...  

Author(s):  
Masanori MATSUSHITA ◽  
Nobukatsu OKUIZUMI ◽  
Yasutaka SATOU ◽  
Osamu MORI ◽  
Takashi IWASA ◽  
...  

2020 ◽  
Author(s):  
Meng Wei ◽  
Tian-bao Chen ◽  
Ju-guang Hu ◽  
Shuo Chen ◽  
Hongli Ma ◽  
...  

1995 ◽  
Vol 403 ◽  
Author(s):  
T. S. Hayes ◽  
F. T. Ray ◽  
K. P. Trumble ◽  
E. P. Kvam

AbstractA refined thernodynamic analysis of the reaction between molen Al and SiC is presented. The calculations indicate much higher Si concentrations for saturation with respect to AkC 3 formation than previously reported. Preliminary microstructural studies confirm the formation of interfacial A14C3 for pure Al thin films on SiC reacted at 9000C. The implications of the calculations and experimental observations for the production of ohmic contacts to p-type SiC are discussed.


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