Structural characterization of isomeric triazolocoumarins by high- and low-energy collision spectrometry of M+˙, [M + H]+ and [M − H]− species

1991 ◽  
Vol 26 (8) ◽  
pp. 688-694 ◽  
Author(s):  
C. Evans ◽  
P. Traldi ◽  
A. Chilin ◽  
G. Pastorini ◽  
P. Rodighiero
Keyword(s):  
Structural Characterization ◽  
Low Energy ◽  
Energy Collision

scholarly journals Electrospray Tandem Mass Spectrometry of 3'-azido-2',3'dideoxythymidine and of a Novel Series of 3'-azido-2',3',4'-trideoxy-4'thio-5-halogenouridines and their Respective α-Anomers

1994 ◽  
Vol 12 (2) ◽  
pp. 69-83 ◽  
Author(s):  
Joseph Banoub ◽  
Emmanuel Gentil ◽  
Bougrine Tber ◽  
Nour-Eddine Fahmi ◽  
Gino Ronco ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Tandem Mass Spectrometry ◽  
Structural Characterization ◽  
Electrospray Mass Spectrometry ◽  
Low Energy ◽  
Tandem Mass ◽  
The Novel ◽  
Electrospray Tandem Mass Spectrometry ◽  
Protonated Molecules

Electrospray mass spectrometry has aided the structural characterization of 3'-azido-2',3'-dideoxythymidine (AZI) and the novel series of 3'-azido-2',3',4'trideoxy-4'-thio-S-(bromo, chi oro or fluoro )uridine nucleosides and their respective α.anomers. Low energy CAD MS/MS analysis of the protonated molecules [M+H]+confmned the predicted fragmentation route for AZT and a series of related 4'-thio-S-halogenouridines. This MSIMS study also provided characteristic fingerprint patterns which permitted differentiation of anomers within the series of 3'-azido-2' ,3' ,4' -trideoxy-4' -thio-S-halogenouridine nucleosides.

Structural properties of ultra-low-energy ion-implanted silicon studied by combined X-ray scattering methods

2006 ◽  
Vol 39 (4) ◽  
pp. 571-581 ◽  
Author(s):  
L. Capello ◽  
T. H. Metzger ◽  
V. Holý ◽  
M. Servidori ◽  
A. Malachias
Keyword(s):  
Structural Characterization ◽  
Bragg Reflection ◽  
Complete Characterization ◽  
Low Energy ◽  
Diffuse Intensity ◽  
Near Surface ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

The use of a combination of X-ray scattering techniques for the complete characterization of ultra-low-energy (E< 5 keV) implanted Si is discussed. Grazing incidence diffuse X-ray scattering (GI-DXS) reveals the properties of the defects confined within thin crystalline layers with depth resolution. Due to the weak diffuse intensity arising from such defects, the high brilliance of synchrotron radiation is required. GI-DXS proved to be particularly well suited for the investigation of the so-called `end-of-range' defects. In a complementary way, X-ray diffraction (XRD) in the vicinity of the 004 Bragg reflection is sensitive to the distribution of the strain in the Si lattice in the direction perpendicular to the sample surface. The structural characterization is complemented by the electron density profile of the near-surface amorphous region provided by specular reflectivity (SR). It will be shown that only by merging the results obtained with GI-DXS, XRD and SR, is it possible to obtain the detailed structural characterization of the implanted Si samples.

Structural characterization of glutaminergic blocker spider toxins by high-energy collision charge-remote fragmentations

1995 ◽  
Vol 9 (5) ◽  
pp. 365-371 ◽  
Author(s):  
Tsuyoshi Fujita ◽  
Yasuhiro Itagaki ◽  
Hideo Naoki ◽  
Terumi Nakajima ◽  
Ken'ichi Hagiwara
Keyword(s):  
Structural Characterization ◽  
High Energy ◽  
Energy Collision ◽  
High Energy Collision ◽  
Spider Toxins
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