The modified method of characteristics with mixed finite element domain decomposition procedures for the transient behavior of a semiconductor device
2010 ◽
Vol 28
(1)
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pp. 353-368
2015 ◽
Vol 93
(2)
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pp. 123-152
2003 ◽
Vol 23
(3)
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pp. 386-398
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1989 ◽
Vol 26
(6)
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pp. 1462-1473
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2000 ◽
Vol 32
(4)
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pp. 439-463
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2008 ◽
Vol 24
(3)
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pp. 776-798
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