A non-stationary covariance-based Kriging method for metamodelling in engineering design

Ying Xiong; Wei Chen; Daniel Apley; Xuru Ding

doi:10.1002/nme.1969

A non-stationary covariance-based Kriging method for metamodelling in engineering design

International Journal for Numerical Methods in Engineering ◽

10.1002/nme.1969 ◽

2007 ◽

Vol 71 (6) ◽

pp. 733-756 ◽

Cited By ~ 83

Author(s):

Ying Xiong ◽

Wei Chen ◽

Daniel Apley ◽

Xuru Ding

Keyword(s):

Engineering Design ◽

Kriging Method

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A Nonstationary Covariance Based Kriging Method for Metamodeling in Engineering Design

11th AIAA/ISSMO Multidisciplinary Analysis and Optimization Conference ◽

10.2514/6.2006-7050 ◽

2006 ◽

Author(s):

Ying Xiong ◽

Weichen ◽

Dan Apley ◽

Xuru Ding

Keyword(s):

Engineering Design ◽

Kriging Method ◽

Nonstationary Covariance

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Modified screening-based Kriging method with cross validation and application to engineering design

Applied Mathematical Modelling ◽

10.1016/j.apm.2019.01.030 ◽

2019 ◽

Vol 70 ◽

pp. 626-642 ◽

Cited By ~ 12

Author(s):

Kyeonghwan Kang ◽

Caiyan Qin ◽

Bongjae Lee ◽

Ikjin Lee

Keyword(s):

Engineering Design ◽

Cross Validation ◽

Kriging Method

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Resolution and measurement in the scanning electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100127256 ◽

1987 ◽

Vol 45 ◽

pp. 534-537 ◽

Cited By ~ 2

Author(s):

Michael T. Postek

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Engineering Design ◽

Resolving Power ◽

Practical Applications ◽

Instrument Resolution ◽

Accurate Definition ◽

Definition Of ◽

Scanning Electron ◽

Better Than

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.

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