The conventional tuning fork as a quantitative tool for vibration threshold

2017 ◽  
Vol 57 (1) ◽  
pp. 49-53 ◽  
Author(s):  
Mohammed H. Alanazy ◽  
Nuha A. Alfurayh ◽  
Shaza N. Almweisheer ◽  
Bandar N. Aljafen ◽  
Taim Muayqil
1998 ◽  
Vol 65 (5) ◽  
pp. 743-747 ◽  
Author(s):  
I S J Martina ◽  
R van Koningsveld ◽  
P I M Schmitz ◽  
F G A van der Meche ◽  
P A van Doorn

Author(s):  
Arjan Mels ◽  
Frank Zachariasse

Abstract Although RIL, SDL and LADA are slightly different, the main operating principle is the same and the theory for defect localization presented in this paper is applicable to all three methods. Throughout this paper the authors refer to LADA, as all experimental results in this paper were obtained with a 1064nm laser on defect free circuits. This paper first defines mathematically what 'signal strength' actually means in LADA and then demonstrates a statistical model of the LADA situation that explains the optimal conditions for signal collection and the parameters involved. The model is tested against experimental data and is also used to optimise the acquisition time. Through this model, equations were derived for the acquisition time needed to discern a LADA response from the background noise. The model offers a quantitative tool to estimate the feasibility of a given LADA measurement and a guide to optimising the required experimental set-up.


2021 ◽  
pp. 127152
Author(s):  
Abdulfattah A.Q. Alwah ◽  
Li Wen ◽  
Mohammed A.Q. Alwah ◽  
Saddam Shahrah

Micromachines ◽  
2021 ◽  
Vol 12 (3) ◽  
pp. 286
Author(s):  
Ashfaq Ali ◽  
Naveed Ullah ◽  
Asim Ahmad Riaz ◽  
Muhammad Zeeshan Zahir ◽  
Zuhaib Ali Khan ◽  
...  

Quartz Tuning Fork (QTF) based sensors are used for Scanning Probe Microscopes (SPM), in particular for near-field scanning optical microscopy. Highly sharp Tungsten (W) tips with larger cone angles and less tip diameter are critical for SPM instead of platinum and iridium (Pt/Ir) tips due to their high-quality factor, conductivity, mechanical stability, durability and production at low cost. Tungsten is chosen for its ease of electrochemical etching, yielding high-aspect ratio, sharp tips with tens of nanometer end diameters, while using simple etching circuits and basic electrolyte chemistry. Moreover, the resolution of the SPM images is observed to be associated with the cone angle of the SPM tip, therefore Atomic-Resolution Imaging is obtained with greater cone angles. Here, the goal is to chemically etch W to the smallest possible tip apex diameters. Tips with greater cone angles are produced by the custom etching procedures, which have proved superior in producing high quality tips. Though various methods are developed for the electrochemical etching of W wire, with a range of applications from scanning tunneling microscopy (SPM) to electron sources of scanning electron microscopes, but the basic chemical etching methods need to be optimized for reproducibility, controlling cone angle and tip sharpness that causes problems for the end users. In this research work, comprehensive experiments are carried out for the production of tips from 0.4 mm tungsten wire by three different electrochemical etching techniques, that is, Alternating Current (AC) etching, Meniscus etching and Direct Current (DC) etching. Consequently, sharp and high cone angle tips are obtained with required properties where the results of the W etching are analyzed, with optical microscope, and then with field emission scanning electron microscopy (FE-SEM). Similarly, effects of varying applied voltages and concentration of NaOH solution with comparison among the produced tips are investigated by measuring their cone angle and tip diameter. Moreover, oxidation and impurities, that is, removal of contamination and etching parameters are also studied in this research work. A method has been tested to minimize the oxidation on the surface and the tips were characterized with scanning electron microscope (SEM).


Author(s):  
Roy Cerqueti ◽  
Eleonora Cutrini

AbstractThis paper deals with the theoretical analysis of the spatial concentration and localization of firms and employees over a set of regions. In particular, it provides a simple site-selection theoretical model to describe the probabilistic framework of the location patterns. The adopted quantitative tool is the stochastic theory of urns. The model moves from the empirical evidence of the deviation of the spatial location of companies from the uniform distribution and of employees from the distribution of firms. Factors leading to such deviations are taken into consideration. Specifically, we formalize a decision problem grounded on the economic attributes of the regions and also on the distribution of the existing firms and employees in the territory. To our purpose, the site-selection model is presented as a stepwise process.


Nanoscale ◽  
2012 ◽  
Vol 4 (20) ◽  
pp. 6493 ◽  
Author(s):  
Sangmin An ◽  
Corey Stambaugh ◽  
Gunn Kim ◽  
Manhee Lee ◽  
Yonghee Kim ◽  
...  

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