scholarly journals Similarity‐driven multi‐dimensional binning algorithm (SIMBA) for free‐running motion‐suppressed whole‐heart MRA

Author(s):  
John Heerfordt ◽  
Kevin K. Whitehead ◽  
Jessica A. M. Bastiaansen ◽  
Lorenzo Di Sopra ◽  
Christopher W. Roy ◽  
...  
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2019 ◽  
Vol 82 (4) ◽  
pp. 1331-1342 ◽  
Author(s):  
Haikun Qi ◽  
Olivier Jaubert ◽  
Aurelien Bustin ◽  
Gastao Cruz ◽  
Huijun Chen ◽  
...  

2019 ◽  
Vol 83 (1) ◽  
pp. 45-55 ◽  
Author(s):  
Jessica A.M. Bastiaansen ◽  
Davide Piccini ◽  
Lorenzo Di Sopra ◽  
Christopher W. Roy ◽  
John Heerfordt ◽  
...  

2019 ◽  
Vol 63 ◽  
pp. 159-169 ◽  
Author(s):  
Haikun Qi ◽  
Aurelien Bustin ◽  
Gastao Cruz ◽  
Olivier Jaubert ◽  
Huijun Chen ◽  
...  

2019 ◽  
Vol 82 (6) ◽  
pp. 2118-2132 ◽  
Author(s):  
Lorenzo Di Sopra ◽  
Davide Piccini ◽  
Simone Coppo ◽  
Matthias Stuber ◽  
Jérôme Yerly

2014 ◽  
Vol 74 (5) ◽  
pp. 1306-1316 ◽  
Author(s):  
Simone Coppo ◽  
Davide Piccini ◽  
Gabriele Bonanno ◽  
Jérôme Chaptinel ◽  
Gabriella Vincenti ◽  
...  

2020 ◽  
Vol 34 (1) ◽  
Author(s):  
Thomas Küstner ◽  
Aurelien Bustin ◽  
Olivier Jaubert ◽  
Reza Hajhosseiny ◽  
Pier Giorgio Masci ◽  
...  

2013 ◽  
Vol E96.C (2) ◽  
pp. 241-244
Author(s):  
Ryuta YAMANAKA ◽  
Taka FUJITA ◽  
Hideyuki SOTOBAYASHI ◽  
Atsushi KANNO ◽  
Tetsuya KAWANISHI

Author(s):  
O. Breitenstein ◽  
J.P. Rakotoniaina ◽  
F. Altmann ◽  
J. Schulz ◽  
G. Linse

Abstract In this paper new thermographic techniques with significant improved temperature and/or spatial resolution are presented and compared with existing techniques. In infrared (IR) lock-in thermography heat sources in an electronic device are periodically activated electrically, and the surface is imaged by a free-running IR camera. By computer processing and averaging the images over a certain acquisition time, a surface temperature modulation below 100 µK can be resolved. Moreover, the effective spatial resolution is considerably improved compared to stead-state thermal imaging techniques, since the lateral heat diffusion is suppressed in this a.c. technique. However, a serious limitation is that the spatial resolution is limited to about 5 microns due to the IR wavelength range of 3 -5 µm used by the IR camera. Nevertheless, we demonstrate that lock-in thermography reliably allows the detection of defects in ICs if their power exceeds some 10 µW. The imaging can be performed also through the silicon substrate from the backside of the chip. Also the well-known fluorescent microthermal imaging (FMI) technique can be be used in lock-in mode, leading to a temperature resolution in the mK range, but a spatial resolution below 1 micron.


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