scholarly journals The dose response of high‐resolution diode‐type detectors and the role of their structural components in strong magnetic field

2020 ◽  
Author(s):  
Tuba Tekin ◽  
Isabel Blum ◽  
Björn Delfs ◽  
Ann‐Britt Schönfeld ◽  
Ralf‐Peter Kapsch ◽  
...  
2020 ◽  
Vol 152 ◽  
pp. S353
Author(s):  
T. Tekin ◽  
B. Delfs ◽  
I. Büsing ◽  
A. Schönfeld ◽  
B. Poppe ◽  
...  

2021 ◽  
Author(s):  
Björn Delfs ◽  
Isabel Blum ◽  
Tuba Tekin ◽  
Ann‐Britt Schönfeld ◽  
Rafael Kranzer ◽  
...  

2017 ◽  
Vol 20 (3) ◽  
pp. 128-135
Author(s):  
A.A. Kudreyko ◽  
R.N. Migranova ◽  
A.R. Khafizov

The role of anchoring effects in thin nematic films confined between two parallel plates was theoretically examined. The bulk and surface free energy densities weree xpanded up to O(e2) and the perturbated contributions were calculated. It is shown that the minimum of the free energy corresponds to the solution of the Euler-Lagrange equations and satisfies the Ericksen inequalities. The identified bifurcation points can estimate the influence of the saddle-splay constant k24 towards periodic perturbations of a director in the presence of strong magnetic field.


Author(s):  
Xiao Zhang

Electron holography has recently been available to modern electron microscopy labs with the development of field emission electron microscopes. The unique advantage of recording both amplitude and phase of the object wave makes electron holography a effective tool to study electron optical phase objects. The visibility of the phase shifts of the object wave makes it possible to directly image the distributions of an electric or a magnetic field at high resolution. This work presents preliminary results of first high resolution imaging of ferroelectric domain walls by electron holography in BaTiO3 and quantitative measurements of electrostatic field distribution across domain walls.


Author(s):  
S. Horiuchi ◽  
Y. Matsui

A new high-voltage electron microscope (H-1500) specially aiming at super-high-resolution (1.0 Å point-to-point resolution) is now installed in National Institute for Research in Inorganic Materials ( NIRIM ), in collaboration with Hitachi Ltd. The national budget of about 1 billion yen including that for a new building has been spent for the construction in the last two years (1988-1989). Here we introduce some essential characteristics of the microscope.(1) According to the analysis on the magnetic field in an electron lens, based on the finite-element-method, the spherical as well as chromatic aberration coefficients ( Cs and Cc ). which enables us to reach the resolving power of 1.0Å. have been estimated as a function of the accelerating As a result of the calculaton. it was noted that more than 1250 kV is needed even when we apply the highest level of the technology and materials available at present. On the other hand, we must consider the protection against the leakage of X-ray. We have then decided to set the conventional accelerating voltage at 1300 kV. However. the maximum accessible voltage is 1500 kV, which is practically important to realize higher voltage stabillity. At 1300 kV it is expected that Cs= 1.7 mm and Cc=3.4 mm with the attachment of the specimen holder, which tilts bi-axially in an angle of 35° ( Fig.1 ). In order to minimize the value of Cc a small tank is additionally placed inside the generator tank, which must serve to seal the magnetic field around the acceleration tube. An electron gun with LaB6 tip is used.


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