Propagation of profiled optical beams through kerr media

1991 ◽  
Vol 4 (11) ◽  
pp. 471-475
Author(s):  
Partha P. Banerjee ◽  
Raj M. Misra
Keyword(s):  
2006 ◽  
Vol 261 (1) ◽  
pp. 175-180 ◽  
Author(s):  
Yi Huang ◽  
Qi Guo ◽  
Jueneng Cao
Keyword(s):  

1993 ◽  
Vol 18 (21) ◽  
pp. 1795 ◽  
Author(s):  
Andrew T. Ryan ◽  
Govind P. Agrawal

2012 ◽  
Vol 44 (7) ◽  
pp. 2100-2105
Author(s):  
Xing Guo ◽  
Xiquan Fu ◽  
Lianglong Wu

Author(s):  
Charles Zhang ◽  
Matt Thayer ◽  
Lowell Herlinger ◽  
Greg Dabney ◽  
Manuel Gonzalez

Abstract A number of backside analysis techniques rely on the successful use of optical beams in performing backside fault isolation. In this paper, the authors have investigated the influence of the 1340 nm and 1064 nm laser wavelength on advanced CMOS transistor performance.


2020 ◽  
Vol 102 (6) ◽  
Author(s):  
Carlos Ruiz-Jiménez ◽  
Hervé Leblond ◽  
Miguel A. Porras ◽  
Boris A. Malomed
Keyword(s):  

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