Processing of a Strong Biodegradable Poly[(R)-3-hydroxybutyrate] Fiber and a New Fiber Structure Revealed by Micro-Beam X-Ray Diffraction with Synchrotron Radiation

2004 ◽  
Vol 25 (11) ◽  
pp. 1100-1104 ◽  
Author(s):  
Tadahisa Iwata ◽  
Yoshihiro Aoyagi ◽  
Masahiro Fujita ◽  
Hideki Yamane ◽  
Yoshiharu Doi ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Fiber Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Biodegradable Poly

scholarly journals X-ray imaging of silicon die within fully packaged semiconductor devices

2021 ◽  
pp. 1-7
Author(s):  
Brian K. Tanner ◽  
Patrick J. McNally ◽  
Andreas N. Danilewsky
Keyword(s):  
Synchrotron Radiation ◽  
Feasibility Studies ◽  
Monochromatic Radiation ◽  
X Ray Diffraction ◽  
Divergent Beam ◽  
X Ray ◽  
X Ray Imaging ◽  
Setting Process ◽  
Diffraction Imaging ◽  
Lattice Planes

X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Analog Devices AD9253 die initially falls, but after 100 °C, it rises again. The twist across the die wafer falls linearly with an increase in temperature. At 200 °C, the tilt varies approximately linearly with position, that is, displacement varies quadratically along the die. The warpage is approximately reversible on cooling, suggesting that it has a simple paraboloidal form prior to encapsulation; the complex tilt and twisting result from the polymer setting process. Feasibility studies are reported, which demonstrate that a divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurements by XRDI in the laboratory. Existing tools have limitations because of the geometry of the X-ray optics, resulting in applicability only to simple warpage structures. The necessary modifications required for use in situations of complex warpage, for example, in multiple die interconnected packages are specified.

Visualization of spontaneous electronic polarization in Pb ion of ferroelectric PbTiO3 by synchrotron-radiation x-ray diffraction

2020 ◽  
Vol 117 (25) ◽  
pp. 252905
Author(s):  
Tomohiro Abe ◽  
Sangwook Kim ◽  
Chikako Moriyoshi ◽  
Yuuki Kitanaka ◽  
Yuji Noguchi ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
X Ray Diffraction ◽  
Electronic Polarization ◽  
X Ray

Refinement of the crystal structure of sieleckiite and revision of its symmetry

2017 ◽  
Vol 81 (4) ◽  
pp. 917-922
Author(s):  
Peter Elliott
Keyword(s):  
Crystal Structure ◽  
Synchrotron Radiation ◽  
Single Crystal ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
Aluminium Phosphate ◽  
Unit Cell Parameters ◽  
X Ray ◽  
Cell Parameters ◽  
Phosphate Mineral

AbstractThe crystal structure of the copper aluminium phosphate mineral sieleckiite, Cu3Al4(PO4)2 (OH)12·2H2O, from the Mt Oxide copper mine, Queensland, Australia was solved from single-crystal X-ray diffraction data utilizing synchrotron radiation. Sieleckiite has monoclinic rather than triclinic symmetry as previously reported and is space group C2/m with unit-cell parameters a = 11.711(2), b = 6.9233(14), c = 9.828(2) Å, β = 92.88(3)°, V = 795.8(3) Å3and Z = 2. The crystal structure, which has been refined to R1 = 0.0456 on the basis of 1186 unique reflections with Fo > 4σF, is a framework of corner-, edge- and face- sharing Cu and Al octahedra and PO4 tetrahedra.

X-ray diffraction gratings for synchrotron radiation spectroscopy: a new fabrication method

1982 ◽  
Vol 21 (15) ◽  
pp. 2787 ◽  
Author(s):  
Shinji Matsui ◽  
Kazuyuki Moriwaki ◽  
Hiroaki Aritome ◽  
Susumu Namba ◽  
Shik Shin ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Diffraction Gratings ◽  
Fabrication Method ◽  
X Ray Diffraction ◽  
X Ray
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