Nano-Structural Observation of in situ Silica in Natural Rubber Matrix by Three Dimensional Transmission Electron Microscopy

2004 ◽  
Vol 25 (12) ◽  
pp. 1186-1190 ◽  
Author(s):  
Yuko Ikeda ◽  
Atsushi Katoh ◽  
Junichi Shimanuki ◽  
Shinzo Kohjiya
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Natural Rubber ◽  
Three Dimensional ◽  
Rubber Matrix ◽  
In Situ Silica ◽  
Transmission Electron

scholarly journals In Situ Transmission Electron Microscopy Imaging of Electromigration in Platinum Nanowires

2013 ◽  
Vol 19 (S5) ◽  
pp. 43-48 ◽  
Author(s):  
Maria Rudneva ◽  
Bo Gao ◽  
Ferry Prins ◽  
Qiang Xu ◽  
Herre S.J. van der Zant ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Feedback Control ◽  
Three Dimensional ◽  
Dark Field ◽  
Control Mode ◽  
Microscopy Imaging ◽  
Platinum Nanowires ◽  
Transmission Electron

AbstractIn situ transmission electron microscopy was performed on the electromigration in platinum (Pt) nanowires (14 nm thick, 200 nm wide, and 300 nm long) with and without feedback control. Using the feedback control mode, symmetric electrodes are obtained and the gap usually forms at the center of the Pt nanowire. Without feedback control, asymmetric electrodes are formed, and the gap can occur at any position along the wire. The three-dimensional gap geometries of the electrodes in the Pt nanowire were determined using high-angle annular dark-field scanning transmission electron microscopy; the thickness of the nanowire is reduced from 14 nm to only a few atoms at the edge with a gap of about 5–10 nm.

Nanostructure in Traditional Composites of Natural Rubber and Reinforcing Silica

2007 ◽  
Vol 80 (4) ◽  
pp. 690-700 ◽  
Author(s):  
Atsushi Kato ◽  
Shinzo Kohjiya ◽  
Yuko Ikeda
Keyword(s):  
Electron Microscopy ◽  
Carbon Black ◽  
Natural Rubber ◽  
Electron Tomography ◽  
3D Visualization ◽  
Three Dimensional ◽  
Rubber Matrix ◽  
3D Images ◽  
Transmission Electron ◽  
Filler Dispersion

Abstract Usual rubber products are a composite from rubber and nano-filler (e.g. silica, carbon black, etc.), and it is believed that the good dispersion of the nano-filler is the most important issue determining the performance of rubber vulcanizates. So far, transmission electron microscopy (TEM) has been the most useful tool for evaluation of the dispersion. However, it affords images of the sample projected on an x, y-plane, and the information along the thickness (z-axis) direction is missing. Three-dimensional (3D) visualization of nanometer structure of nano-filler dispersion in a rubber matrix is what all rubber technologists have been dreaming of. This dream is at last realized, and described in this paper. Use of TEM combined with computerized tomography (abbreviated as 3D-TEM in this paper, which is sometimes called electron tomography) enabled us to reconstruct 3D images of nano-filler (silica or carbon black) aggregates in rubbery matrix. It is said that nano-filler aggregate is a structure of size from 10 nm to 1000 nm, and agglomerate is an even larger structure. The 3D-TEM results on silica aggregates in natural rubber were presented in this paper. Silica aggregates were characterized by combining the 3D images of the vulcanizates. Furthermore, density of silica loaded natural rubber as an example of physical properties, was measured, and explained by the structure elucidated by 3D-TEM.

The Low-temperature Initial Oxidation Stages of Cu(100) Investigated by in situ Ultra-high-vacuum Transmission Electron Microscopy

2005 ◽  
Vol 20 (7) ◽  
pp. 1910-1917 ◽  
Author(s):  
L. Sun ◽  
J.C. Yang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Vacuum ◽  
Three Dimensional ◽  
Nucleation And Growth ◽  
Ultra High Vacuum ◽  
Initial Oxidation ◽  
Triangular Shape ◽  
Transmission Electron

The nucleation and growth of Cu2O islands due to Cu(100) oxidation at temperatures from 200 to 350 °C have been observed by in situ ultra-high-vacuum transmission electron microscopy. For this temperature range, epitaxial Cu2O islands form a triangular shape with rounded edges when Cu(100) is exposed to dry oxygen at 5 × 10−4 Torr in situ. Our initial analysis on the nucleation and growth of these three-dimensional Cu2O islands agrees well with the heteroepitaxial model of surface diffusion of oxygen.

In situ atomic scale visualization of surface kinetics driven dynamics of oxide growth on a Ni–Cr surface

2016 ◽  
Vol 52 (16) ◽  
pp. 3300-3303 ◽  
Author(s):  
Langli Luo ◽  
Lianfeng Zou ◽  
Daniel K. Schreiber ◽  
Matthew J. Olszta ◽  
Donald R. Baer ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Three Dimensional ◽  
Atomic Scale ◽  
Oxide Growth ◽  
Surface Kinetics ◽  
Initial Oxidation ◽  
Transmission Electron ◽  
Dimensional Growth

We report the in situ atomic-scale visualization of the dynamic three-dimensional growth of NiO during the initial oxidation of Ni–10at%Cr using environmental transmission electron microscopy.

Edge-to-Edge Matching at Ti-TiH Interfaces: Kinetics of Hydride Growth and Clustering of Precipitates with Different Orientation Relationships

2011 ◽  
Vol 172-174 ◽  
pp. 242-247 ◽  
Author(s):  
Egle Conforto ◽  
Daniel Caillard
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Volume Expansion ◽  
Three Dimensional ◽  
Orientation Relationships ◽  
Edge Matching ◽  
Transmission Electron ◽  
Isotropic Distribution ◽  
Kinetics Of

The motion of steps during the growth of hydride precipitates has been observed by in situ transmission electron microscopy. Precipitates in different orientation relationships (OR) are shown to obey to the rules of three-dimensional edge-to-edge matching. They form clusters in order to realize a more isotropic distribution of the volume expansion, and to decrease their total elastic energy.

Simulation of three Dimensional Defect Images in Transmission Electron Microscopy

1976 ◽  
Vol 34 ◽  
pp. 470-471
Author(s):  
W. D. Cooper ◽  
C. S. Hartley ◽  
J. J. Hren
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Three Dimensional ◽  
Crystalline Lattice ◽  
Continuum Models ◽  
Thin Foils ◽  
Transmission Electron ◽  
Microscope Images ◽  
General Computer Program ◽  
General Computer

Interpretation of electron microscope images of crystalline lattice defects can be greatly aided by computer simulation of theoretical contrast from continuum models of such defects in thin foils. Several computer programs exist at the present time, but none are sufficiently general to permit their use as an aid in the identification of the range of defect types encountered in electron microscopy. This paper presents progress in the development of a more general computer program for this purpose which eliminates a number of restrictions contained in other programs. In particular, the program permits a variety of foil geometries and defect types to be simulated.The conventional approximation of non-interacting columns is employed for evaluation of the two-beam dynamical scattering equations by a piecewise solution of the Howie-Whelan equations.

Epitaxy and texture analysis of Bi-Sr-Ca-Cu-O thin films on (100) MgO using Transmission Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 68-69
Author(s):  
J. T. Sizemore ◽  
D. G. Schlom ◽  
Z. J. Chen ◽  
J. N. Eckstein ◽  
I. Bozovic ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Critical Currents ◽  
Unit Cell ◽  
X Ray Diffraction ◽  
Cell Axis ◽  
Transmission Electron ◽  
Synthesis Procedure

Investigators observe large critical currents for superconducting thin films deposited epitaxially on single crystal substrates. The orientation of these films is often characterized by specifying the unit cell axis that is perpendicular to the substrate. This omits specifying the orientation of the other unit cell axes and grain boundary angles between grains of the thin film. Misorientation between grains of YBa2Cu3O7−δ decreases the critical current, even in those films that are c axis oriented. We presume that these results are similar for bismuth based superconductors and report the epitaxial orientations and textures observed in such films.Thin films of nominally Bi2Sr2CaCu2Ox were deposited on MgO using molecular beam epitaxy (MBE). These films were in situ grown (during growth oxygen was incorporated and the films were not oxygen post-annealed) and shuttering was used to encourage c axis growth. Other papers report the details of the synthesis procedure. The films were characterized using x-ray diffraction (XRD) and transmission electron microscopy (TEM).

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