scholarly journals Miniature plankton columns to study the depth distribution of zooplankton at gradients of food, predation risk, temperature, and UV radiation

2015 ◽  
Vol 14 (3) ◽  
pp. 210-223 ◽  
Author(s):  
Piotr Maszczyk
2006 ◽  
Vol 94 (2) ◽  
pp. 455-463 ◽  
Author(s):  
CHRISTIAN WIENCKE ◽  
MICHAEL Y. ROLEDA ◽  
ANSGAR GRUBER ◽  
MARGARET N. CLAYTON ◽  
KAI BISCHOF

2004 ◽  
Vol 14 (4) ◽  
pp. 1055-1064 ◽  
Author(s):  
Tiffany S. Garcia ◽  
Jodi Stacy ◽  
Andrew Sih

Author(s):  
J. Hanker ◽  
B. Giammara ◽  
G. Strauss

Only a fraction of the UV radiation emitted by the sun reaches the earth; most of the UVB (290-320nm) is eliminated by stratospheric ozone. There is increasing concern, however, that man-made chemicals are damaging this ozone layer. Although the effects of UV on DNA or as a carcinogen are widely known, preleukemia and acute myeloid leukemia (AML) have only rarely been reported in psoriasis patients treated with 8-methoxypsoralen and UV (PUVA). It was therefore of interest to study the effects of UV on the myeloperoxidase (MP) activity of human neutrophils. The peroxidase activity of enriched leukocyte preparations on coverslips was shown cytochemically with a diaminobenzidine medium and cupric nitrate intensification.Control samples (Figs. 1,4,5) of human bloods that were not specifically exposed to UV radiation or light except during routine handling were compared with samples which had been exposed in one of several different ways. One preparation (Fig. 2) was from a psoriasis patient who had received whole-body UVB phototherapy repeatedly.


Author(s):  
S.F. Corcoran

Over the past decade secondary ion mass spectrometry (SIMS) has played an increasingly important role in the characterization of electronic materials and devices. The ability of SIMS to provide part per million detection sensitivity for most elements while maintaining excellent depth resolution has made this technique indispensable in the semiconductor industry. Today SIMS is used extensively in the characterization of dopant profiles, thin film analysis, and trace analysis in bulk materials. The SIMS technique also lends itself to 2-D and 3-D imaging via either the use of stigmatic ion optics or small diameter primary beams.By far the most common application of SIMS is the determination of the depth distribution of dopants (B, As, P) intentionally introduced into semiconductor materials via ion implantation or epitaxial growth. Such measurements are critical since the dopant concentration and depth distribution can seriously affect the performance of a semiconductor device. In a typical depth profile analysis, keV ion sputtering is used to remove successive layers the sample.


Author(s):  
S.J.B. Reed

Characteristic fluorescenceThe theory of characteristic fluorescence corrections was first developed by Castaing. The same approach, with an improved expression for the relative primary x-ray intensities of the exciting and excited elements, was used by Reed, who also introduced some simplifications, which may be summarized as follows (with reference to K-K fluorescence, i.e. K radiation of element ‘B’ exciting K radiation of ‘A’):1.The exciting radiation is assumed to be monochromatic, consisting of the Kα line only (neglecting the Kβ line).2.Various parameters are lumped together in a single tabulated function J(A), which is assumed to be independent of B.3.For calculating the absorption of the emerging fluorescent radiation, the depth distribution of the primary radiation B is represented by a simple exponential.These approximations may no longer be justifiable given the much greater computing power now available. For example, the contribution of the Kβ line can easily be calculated separately.


Author(s):  
P.-F. Staub ◽  
C. Bonnelle ◽  
F. Vergand ◽  
P. Jonnard

Characterizing dimensionally and chemically nanometric structures such as surface segregation or interface phases can be performed efficiently using electron probe (EP) techniques at very low excitation conditions, i.e. using small incident energies (0.5<E0<5 keV) and low incident overvoltages (1<U0<1.7). In such extreme conditions, classical analytical EP models are generally pushed to their validity limits in terms of accuracy and physical consistency, and Monte-Carlo simulations are not convenient solutions as routine tools, because of their cost in computing time. In this context, we have developed an intermediate procedure, called IntriX, in which the ionization depth distributions Φ(ρz) are numerically reconstructed by integration of basic macroscopic physical parameters describing the electron beam/matter interaction, all of them being available under pre-established analytical forms. IntriX’s procedure consists in dividing the ionization depth distribution into three separate contributions:


2019 ◽  
Author(s):  
Gretchen F. Wagner ◽  
Emeline Mourocq ◽  
Michael Griesser

Predation of offspring is the main cause of reproductive failure in many species, and the mere fear of offspring predation shapes reproductive strategies. Yet, natural predation risk is ubiquitously variable and can be unpredictable. Consequently, the perceived prospect of predation early in a reproductive cycle may not reflect the actual risk to ensuing offspring. An increased variance in investment across offspring has been linked to breeding in unpredictable environments in several taxa, but has so far been overlooked as a maternal response to temporal variation in predation risk. Here, we experimentally increased the perceived risk of nest predation prior to egg-laying in seven bird species. Species with prolonged parent-offspring associations increased their intra-brood variation in egg, and subsequently offspring, size. High risk to offspring early in a reproductive cycle can favour a risk-spreading strategy particularly in species with the greatest opportunity to even out offspring quality after fledging.


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