Depth profiles of suspended carbon and nitrogen along a North Pacific transect: Concentrations, isotopes, and ratios

2021 ◽  
Author(s):  
Sijia Dong ◽  
Xingchen Tony Wang ◽  
Adam V. Subhas ◽  
Frank J. Pavia ◽  
Jess F. Adkins ◽  
...  
2020 ◽  
Vol 36 (3) ◽  
pp. 925-938
Author(s):  
Ekaterina A. Borisova ◽  
Olga A. Filatova ◽  
Ivan D. Fedutin ◽  
Alexei V. Tiunov ◽  
Olga V. Shpak ◽  
...  

2014 ◽  
Vol 126 ◽  
pp. 168-179 ◽  
Author(s):  
Rumi Sohrin ◽  
Kunimatsu Imanishi ◽  
Yoshimi Suzuki ◽  
Kenshi Kuma ◽  
Ichiro Yasuda ◽  
...  

Author(s):  
Masatoshi Moku ◽  
Kouichi Kawaguchi

Water, carbon, and nitrogen contents were analysed in both juvenile and adult specimens of Diaphus theta, Stenobrachius leucopsarus, and S. nannochir, which are the dominant myctophid species in the subarctic and transition waters of the North Pacific. The relationship between body length and dry weight, carbon content, and nitrogen content of these three species were expressed as double logarithmic equations. The differences in chemical content among the different size-classes of each species may be associated with reproductive biology.


2001 ◽  
Vol 15 (28n29) ◽  
pp. 1382-1390
Author(s):  
ANDREAS MARKWITZ ◽  
MATHIAS WALDSCHMIDT

Ion beam analysis was used to investigate the influence of substrate temperature on the inclusion of impurities during the deposition process of thin metallic single and double layers. Thin layers of gold and aluminium were deposited at different temperatures onto thin copper layers evaporated on silicon wafer substrates. The uptake of oxygen in the layers was measured using the highly sensitive non-resonant reaction 16 O(d,p) 170 O at 920 keV. Nuclear reaction analysis was also used to probe for carbon and nitrogen with a limit of detection better than 20 ppm. Hydrogen depth profiles were measured using elastic recoil detection on the nanometer scale. Rutherford backscattering spectroscopy was used to determine the depth profiles of the metallic layers and to study diffusion processes. The combined ion beam analyses revealed an uptake of oxygen in the layers depending on the different metallic cap layers and the deposition temperature. Lowest oxygen values were measured for the Au/Cu layers, whereas the highest amount of oxygen was measured in Al/Cu layers deposited at 300°C. It was also found that with single copper layers produced at various temperatures, oxygen contamination occurred during the evaporation process and not afterwards, for example, as a consequence of the storage of the films under normal conditions for several days. Hydrogen, carbon, and nitrogen were found as impurities in the single and double layered metallic films, a finding that is in agreement with the measured oxidation behaviour of the metallic films.


2007 ◽  
Vol 556-557 ◽  
pp. 659-662 ◽  
Author(s):  
Hiroaki Saitoh ◽  
Akinori Seki ◽  
Akira Manabe ◽  
Tsunenobu Kimoto

In this study, we have investigated N2O oxidation of various off-angled 4H-SiC (0001) epilayers and characterized the properties of MOS interfaces. The oxide thickness almost linearly increases with increasing off-angle. Oxidation on highly off-angled (0001) 4H-SiC is faster than that on 8o off-axis (0001). The off-angle dependence of Dit is very small for the MOS capacitors in the off-angle range from 8o to 30o. The depth profiles of carbon and nitrogen atoms near the MOS interface on 15o off-axis 4H-SiC(0001) are similar to those on 8o off-axis (0001).


2019 ◽  
Vol 217 ◽  
pp. 103705 ◽  
Author(s):  
Blaire P. Umhau ◽  
Claudia R. Benitez-Nelson ◽  
Hilary G. Close ◽  
Cecelia C.S. Hannides ◽  
Laura Motta ◽  
...  

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