An AMOLED pixel circuit for high image quality of 1000 ppi mobile displays in AR and VR applications

2018 ◽  
Vol 26 (2) ◽  
pp. 71-78 ◽  
Author(s):  
Nack-Hyeon Keum ◽  
Seong-Kwan Hong ◽  
Chong Chul Chai ◽  
Oh-Kyong Kwon
2009 ◽  
Vol 40 (1) ◽  
pp. 532 ◽  
Author(s):  
Jignesh Gandhi ◽  
Je Hong Kim ◽  
Nesbitt Hagood ◽  
Lodewyk Steyn ◽  
John Fijol ◽  
...  

2012 ◽  
Vol 39 (2) ◽  
pp. 154-168
Author(s):  
Hung-Shing Chen ◽  
Shih-Han Chen ◽  
Yen-Hsiang Chao ◽  
M. Ronnier Luo ◽  
Pei-Li Sun

2019 ◽  
Vol 27 (9) ◽  
pp. 529-535
Author(s):  
Hong Ge Li ◽  
Xiao Yu Guo ◽  
Hui Yuan Lu ◽  
Xibin Shao ◽  
Dongfang Yang ◽  
...  

Author(s):  
F. A. Heckman ◽  
E. Redman ◽  
J.E. Connolly

In our initial publication on this subject1) we reported results demonstrating that contrast is the most important factor in producing the high image quality required for reliable image analysis. We also listed the factors which enhance contrast in order of the experimentally determined magnitude of their effect. The two most powerful factors affecting image contrast attainable with sheet film are beam intensity and KV. At that time we had only qualitative evidence for the ranking of enhancing factors. Later we carried out the densitometric measurements which led to the results outlined below.Meaningful evaluations of the cause-effect relationships among the considerable number of variables in preparing EM negatives depend on doing things in a systematic way, varying only one parameter at a time. Unless otherwise noted, we adhered to the following procedure evolved during our comprehensive study:Philips EM-300; 30μ objective aperature; magnification 7000- 12000X, exposure time 1 second, anti-contamination device operating.


Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.


2001 ◽  
Vol 30 (6) ◽  
pp. 308-313 ◽  
Author(s):  
F Gijbels ◽  
G Sanderink ◽  
C Bou Serhal ◽  
H Pauwels ◽  
R Jacobs

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