Investigation of stress and structural damage in H and He implanted Ge using micro-Raman mapping technique on bevelled samples
2008 ◽
Vol 361
(1-2)
◽
pp. 12-18
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2016 ◽
Vol 5
(3)
◽
pp. 253-261
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Keyword(s):
1983 ◽
Vol 41
◽
pp. 280-281
1982 ◽
Vol 40
◽
pp. 78-79
1969 ◽
Vol 27
◽
pp. 418-419
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Keyword(s):
1992 ◽
Vol 50
(2)
◽
pp. 1514-1515
Keyword(s):