The mechanism of the recrystallization process in epitaxial GaN under dynamic stress field: atomistic origin of planar defect formation
2009 ◽
Vol 40
(12)
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pp. 1881-1884
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Keyword(s):
Keyword(s):
2002 ◽
Vol 36
(15)
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pp. 1803-1824
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2012 ◽
Vol 43
(2)
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pp. 272-279
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Keyword(s):
2005 ◽
Vol 2
(3-4)
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pp. 199-206
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2020 ◽
Vol 962
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pp. 032023