The Effect of Mechanical Processing on Surface Stability of Pharmaceutical Powders: Visualization by Atomic Force Microscopy

2003 ◽  
Vol 92 (3) ◽  
pp. 611-620 ◽  
Author(s):  
Philippe Begat ◽  
Paul M. Young ◽  
Stephen Edge ◽  
J.Sebastian Kaerger ◽  
Robert Price
Keyword(s):  
Atomic Force Microscopy ◽  
Pharmaceutical Powders ◽  
Mechanical Processing ◽  
Surface Stability ◽  
Force Microscopy ◽  
Atomic Force

Nano Mechanical Processing of Silicon by Atomic Force Microscopy

2005 ◽  
Vol 291-292 ◽  
pp. 401-406 ◽  
Author(s):  
S. Miyake ◽  
M. Wang ◽  
J. Kim
Keyword(s):  
Atomic Force Microscopy ◽  
Oxide Layer ◽  
Potassium Hydroxide ◽  
Silicon Surface ◽  
Nanometer Scale ◽  
Mechanical Processing ◽  
Force Microscopy ◽  
Atomic Force ◽  
Processed Sample

Nanometer-scale protuberance and groove processing was performed on a silicon (Si) surface by diamond tip sliding using atomic force microscopy (AFM). The protuberances of 0-5 nm height were obtained the silicon surface by using the diamond tip of approximately 200 nm radius and the grooves of 0-2 nm depth were processed by the tip of about 50 nm radius. It was observed that both protuberance and groove were produced using the tip of about 100 nm radius. Indentation measurements show the hardness of processed parts was greater than that of unprocessed parts. Potassium hydroxide (KOH) solution etching was performed on the mechanochemically processed sample. The processed areas were prevented from etching due to the formation of a dense oxide layer. This may be because the processed parts were oxidized by tip sliding due to the effect of mechanochemical oxidation.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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