Design of a high-sensitivity negative ion source time-of-flight mass analyzer assembly created by cylindrical electrodes with a common axis

2004 ◽  
Vol 39 (12) ◽  
pp. 1403-1407 ◽  
Author(s):  
D. Ioanoviciu ◽  
C. Cuna ◽  
V. Cosma ◽  
I. Albert ◽  
Edina Szilagyi
2011 ◽  
Vol 4 (7) ◽  
pp. 1471-1479 ◽  
Author(s):  
T. H. Bertram ◽  
J. R. Kimmel ◽  
T. A. Crisp ◽  
O. S. Ryder ◽  
R. L. N. Yatavelli ◽  
...  

Abstract. We constructed a new chemical ionization time-of-flight mass spectrometer (CI-TOFMS) that measures atmospheric trace gases in real time with high sensitivity. We apply the technique to the measurement of formic acid via negative-ion proton transfer, using acetate as the reagent ion. A novel high pressure interface, incorporating two RF-only quadrupoles is used to efficiently focus ions through four stages of differential pumping before analysis with a compact TOFMS. The high ion-duty cycle (>20 %) of the TOFMS combined with the efficient production and transmission of ions in the high pressure interface results in a highly sensitive (>300 ions s−1 pptv−1 formic acid) instrument capable of measuring and saving complete mass spectra at rates faster than 10 Hz. We demonstrate the efficient transfer and detection of both bare ions and ion-molecule clusters, and characterize the instrument during field measurements aboard the R/V Atlantis as part of the CalNex campaign during the spring of 2010. The in-field short-term precision is better than 5 % at 1 pptv (pL/L), for 1-s averages. The detection limit (3 σ, 1-s averages) of the current version of the CI-TOFMS, as applied to the in situ detection of formic acid, is limited by the magnitude and variability in the background determination and was determined to be 4 pptv. Application of the CI-TOFMS to the detection of other inorganic and organic acids, as well as the use of different reagent ion molecules (e.g. I−, CF3O−, CO3−) is promising, as we have demonstrated efficient transmission and detection of both bare ions and their associated ion-molecule clusters.


Author(s):  
A. Benninghoven

Progress in many fields of science and technology strongly depends on the availability of appropriate analytical techniques. This becomes increasingly true for all surface related technologies. A most important analytical information concerns the chemical composition of the uppermost monolayers. This information should be supplied with high sensitivity and high resolution, not only for the elemental but also for the molecular surface composition.Time - of - Flight SIMS supplies this molecular information, which cannot be obtained by other surface analytical techniques as AES (Auger electron spectroscopy), XPS (photoelectron spectroscopy), electron microscopy or the electron microprobe. The extremely high transmission allows static SIMS surface analysis with high lateral and mass resolution. Depending on the primary ion source, lateral resolutions below 100 nm are achieved. The Time - of - Flight technique allows parallel acquisition of a large number of ion images. It features an unlimited mass range obtained with an ultimate sensitivity based upon the parallel mass registration and the high transmission.


2021 ◽  
Vol 166 ◽  
pp. 112266
Author(s):  
Lizhen Liang ◽  
Chundong Hu ◽  
Wei Liu ◽  
Jianglong Wei ◽  
Yongjian Xu ◽  
...  

2020 ◽  
Vol 91 (11) ◽  
pp. 113302
Author(s):  
H. Kaminaga ◽  
T. Takimoto ◽  
A. Tonegawa ◽  
K. N. Sato

2021 ◽  
Vol 169 ◽  
pp. 112424
Author(s):  
E. Sartori ◽  
M. Brombin ◽  
B. Laterza ◽  
M. Zuin ◽  
R. Cavazzana ◽  
...  
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