Combination of transmission electron and atomic force microscopy techniques to determine volume equivalent diameter of submicrometer particles

2011 ◽  
Vol 75 (4) ◽  
pp. 505-512 ◽  
Author(s):  
Laarnie Tumolva ◽  
Ji-Yeon Park ◽  
Kihong Park
Keyword(s):  
Atomic Force Microscopy ◽  
Equivalent Diameter ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Microscopy Techniques

scholarly journals Structure determination of channel and transport proteins by high-resolution microscopy techniques

2011 ◽  
Vol 392 (1-2) ◽  
Author(s):  
Marcel Meury ◽  
Daniel Harder ◽  
Zöhre Ucurum ◽  
Rajendra Boggavarapu ◽  
Jean-Marc Jeckelmann ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Transport Proteins ◽  
State Function ◽  
Oligomeric State ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Microscopy Techniques ◽  
High Resolution Microscopy

Abstract High-resolution microscopy techniques provide a plethora of information on biological structures from the cellular level down to the molecular level. In this review, we present the unique capabilities of transmission electron and atomic force microscopy to assess the structure, oligomeric state, function and dynamics of channel and transport proteins in their native environment, the lipid bilayer. Most importantly, membrane proteins can be visualized in the frozen-hydrated state and in buffer solution by cryo-transmission electron and atomic force microscopy, respectively. We also illustrate the potential of the scintillation proximity assay to study substrate binding of detergent-solubilized transporters prior to crystallization and structural characterization.

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

Defect-Engineered Graded GexSi1-x Buffers on Si (001) with Extreme Low Threading Dislocation Density

1995 ◽  
Vol 378 ◽  
Author(s):  
G. Kissinger ◽  
T. Morgenstern ◽  
G. Morgenstern ◽  
H. B. Erzgräber ◽  
H. Richter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Dislocation Density ◽  
Threading Dislocation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Dislocation Densities ◽  
Threading Dislocation Density

AbstractStepwise equilibrated graded GexSii-x (x≤0.2) buffers with threading dislocation densities between 102 and 103 cm−2 on the whole area of 4 inch silicon wafers were grown and studied by transmission electron microscopy, defect etching, atomic force microscopy and photoluminescence spectroscopy.

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