Immunogold detection of types I and II chondrocyte collagen fibrils: An in situ atomic force microscopic investigation

2006 ◽  
Vol 69 (4) ◽  
pp. 283-290 ◽  
Author(s):  
Youri Arntz ◽  
Laurent Jourdainne ◽  
Géraldine Greiner-Wacker ◽  
Simon Rinckenbach ◽  
Joëlle Ogier ◽  
...  
Keyword(s):  
Microscopic Investigation ◽  
Collagen Fibrils ◽  
Atomic Force ◽  
Immunogold Detection

Voltammetric and in situ frequency modulation atomic force microscopic investigation of phenalenyl derivatives adsorbed on graphite surfaces

Carbon ◽  
2014 ◽  
Vol 77 ◽  
pp. 184-190 ◽  
Author(s):  
Toru Utsunomiya ◽  
Yasuyuki Yokota ◽  
Toshiaki Enoki ◽  
Yasukazu Hirao ◽  
Takashi Kubo ◽  
...  
Keyword(s):  
Frequency Modulation ◽  
Microscopic Investigation ◽  
Atomic Force

Experimental investigations into the mechanical properties of the collagen fibril-noncollagenous protein (NCP) interface in antler bone

2010 ◽  
Vol 1274 ◽  
Author(s):  
Fei Hang ◽  
Asa H Barber
Keyword(s):  
Mechanical Properties ◽  
Mechanical Performance ◽  
Collagen Fibrils ◽  
Experimental Investigations ◽  
Shear Stresses ◽  
Structural Hierarchy ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Individual

AbstractAntler is an extraordinary bone tissue that displays significant overall toughness when compared to other bone materials. The origin of this toughness is due to the complex interaction between the nanoscale constituents as well as structural hierarchy in the antler material. Of particular interest is the mechanical performance of the interface between the collagen fibrils and considerably smaller volume of non-collagenous protein (NCP) between these fibrils. This paper directly examines the mechanical properties of isolated volumes of antler using combined in situ atomic force microscopy (AFM)-scanning electron microscopy (SEM) experiments. The antler material at the nanoscale is approximated to a fiber reinforced composite, with composite theory used to evaluate the interfacial shear stresses generated between the individual collagen fibrils and NCP during mechanical loading.

In situ atomic force microscopy of partially demineralized human dentin collagen fibrils

2002 ◽  
Vol 138 (3) ◽  
pp. 227-236 ◽  
Author(s):  
Stefan Habelitz ◽  
Mehdi Balooch ◽  
Sally J Marshall ◽  
Guive Balooch ◽  
Grayson W Marshall
Keyword(s):  
Atomic Force Microscopy ◽  
Collagen Fibrils ◽  
Force Microscopy ◽  
Atomic Force ◽  
Human Dentin ◽  
Dentin Collagen

Intrafibrillar demineralization study of single human dentin collagen fibrils by AFM

2004 ◽  
Vol 823 ◽  
Author(s):  
M. Balooch ◽  
G. Balooch ◽  
S. Habelitz ◽  
S. J. Marshall ◽  
G. W. Marshall
Keyword(s):  
Citric Acid ◽  
Gradual Increase ◽  
Collagen Fibrils ◽  
Wave Number ◽  
Force Microscopy ◽  
Atomic Force ◽  
Human Dentin ◽  
Dentin Collagen ◽  
Kinetics Of

AbstractIn situ atomic force microscopy (AFM) was used to investigate the kinetics of demineralization of human dentin collagen fibrils. Individual dentin collagen fibrils containing intrafibrillar mineral were isolated, transferred onto a glass slide and exposed to water for a day prior to demineralization studies. The fibrils then were exposed to trypsin for removal of non-collagenous proteins and subsequently demineralized in 10 vol % citric acid. Topographic images showed a gradual increase in gap-overlap depth of the fibril. The gap-overlap depth varied linearly with the square root of time before saturation at 7 nm in approximately sixty minutes, suggesting a diffusion process for demineralization of intrafibrillar mineral. Micro Raman studies of partially demineralized dentin revealed the existence of a phosphate peak at wave number close to 960 cm-1. The peak gradually disappeared in 60 minutes as the samples were exposed to 10% citric acid, supporting the notion that AFM topography may be correlated to the degree of intrafibrillar mineralization.

scholarly journals Ultrafine metal-polymer catalysts based on polyconjugated systems for Fisher–Tropsch synthesis

2020 ◽  
Vol 92 (6) ◽  
pp. 977-984
Author(s):  
Mayya V. Kulikova ◽  
Albert B. Kulikov ◽  
Alexey E. Kuz’min ◽  
Anton L. Maximov
Keyword(s):  
Tropsch Synthesis ◽  
X Ray Diffraction ◽  
Fischer Tropsch ◽  
Force Microscopy ◽  
Composite Catalysts ◽  
Fe Catalyst ◽  
Atomic Force ◽  
And Function ◽  
Metal Polymer

AbstractFor previously studied Fischer–Tropsch nanosized Fe catalyst slurries, polymer compounds with or without polyconjugating structures are used as precursors to form the catalyst nanomatrix in situ, and several catalytic experiments and X-ray diffraction and atomic force microscopy measurements are performed. The important and different roles of the paraffin molecules in the slurry medium in the formation and function of composite catalysts with the two types of aforementioned polymer matrices are revealed. In the case of the polyconjugated polymers, the alkanes in the medium are “weakly” coordinated with the metal-polymer composites, which does not affect the effectiveness of the polyconjugated polymers. Otherwise, alkane molecules form a “tight” surface layer around the composite particles, which create transport complications for the reagents and products of Fischer-Tropsch synthesis and, in some cases, can change the course of the in situ catalyst formation.

In situ nanoscale visualization of solvent effects on molecular crystal surfaces

CrystEngComm ◽  
2021 ◽  
Author(s):  
Mikkel Herzberg ◽  
Anders Støttrup Larsen ◽  
Tue Hassenkam ◽  
Anders Østergaard Madsen ◽  
Jukka Rantanen
Keyword(s):  
Solid Solution ◽  
Solvent Effects ◽  
Molecular Crystal ◽  
Rational Design ◽  
Molecular Level ◽  
Molecular Crystals ◽  
Crystal Surfaces ◽  
Solution Interface ◽  
Atomic Force

Solvents can dramatically affect molecular crystals. Obtaining favorable properties for these crystals requires rational design based on molecular level understanding of the solid-solution interface. Here we show how atomic force...

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force
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