A novel atomic force microscope operating in liquid for in situ investigation of electrochemical preparation of porous alumina

2005 ◽  
Vol 66 (2-3) ◽  
pp. 126-131 ◽  
Author(s):  
Haijun Zhang ◽  
Dongxian Zhang ◽  
Yulin He
Keyword(s):  
Atomic Force Microscope ◽  
Porous Alumina ◽  
Electrochemical Preparation ◽  
Atomic Force ◽  
In Situ Investigation

scholarly journals In situ Investigation of Individual Filament Growth in Conducting Bridge Memristor by Contact Scanning Capacitance Microscopy

2021 ◽  
Vol 2086 (1) ◽  
pp. 012205
Author(s):  
M A Ryabova ◽  
D A Antonov ◽  
A V Kruglov ◽  
I N Antonov ◽  
D O Filatov ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Filament Length ◽  
Atomic Force Microscope Probe ◽  
Scanning Capacitance Microscopy ◽  
Atomic Force ◽  
In Situ Investigation ◽  
Conducting Bridge ◽  
Microscope Probe ◽  
Individual Filament

Abstract We report on the application of Contact Scanning Capacitance Microscopy (CSCM) to trace the growth of an individual Ni filament in a ZrO2(Y) film on a Ni sublayer (together with a conductive Atomic Force Microscope probe composing a nanometer-sized virtual memristor). An increasing of the filament length in the course of electro-forming results in an increasing of the capacitance between the probe and the sample, which can be detected by CSCM technique. This way, the filament growth can be monitored in real time in situ.

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

scholarly journals In situ observation of streptavidin-biotin binding on an immunoassay well surface using an atomic force microscope

FEBS Letters ◽  
1996 ◽  
Vol 390 (2) ◽  
pp. 161-164 ◽  
Author(s):  
S. Allen ◽  
J. Davies ◽  
A.C. Dawkes ◽  
M.C. Davies ◽  
J.C. Edwards ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
In Situ Observation ◽  
Atomic Force ◽  
Biotin Binding

scholarly journals Atomic force microscope with an adjustable probe direction and piezoresistive cantilevers operated in tapping-mode / Im Tapping-Modus betriebenes Rasterkraftmikroskop mit einstellbarer Antastrichtung und piezoresistiven Cantilevern

2019 ◽  
Vol 86 (s1) ◽  
pp. 12-16
Author(s):  
Janik Schaude ◽  
Julius Albrecht ◽  
Ute Klöpzig ◽  
Andreas C. Gröschl ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Metrological Traceability ◽  
Step Height ◽  
Tapping Mode ◽  
Atomic Force ◽  
In Situ Calibration ◽  
Measuring Machine ◽  
Piezoresistive Cantilevers

AbstractThis article presents a new tilting atomic force microscope (AFM) with an adjustable probe direction and piezoresistive cantilever operated in tapping-mode. The AFM is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The whole setup is integrated into a nano measuring machine (NMM-1) and the metrological traceability of the piezoresistive cantilever is warranted by in situ calibration on the NMM-1. To demonstrate the capabilities of the tilting AFM, measurements were conducted on a step height standard.

scholarly journals Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope

Sensors ◽  
2019 ◽  
Vol 19 (8) ◽  
pp. 1794 ◽  
Author(s):  
Sangmin An ◽  
Wonho Jhe
Keyword(s):  
Atomic Force Microscope ◽  
Tuning Fork ◽  
High Sensitivity ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Au Nanoparticle ◽  
Ambient Conditions ◽  
Atomic Force ◽  
In Situ Detection

We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF–AFM with force sensor capability and high sensitivity.

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