scholarly journals Individual trabecula segmentation (ITS)-based morphological analyses and microfinite element analysis of HR-pQCT images discriminate postmenopausal fragility fractures independent of DXA measurements

2012 ◽  
Vol 27 (2) ◽  
pp. 263-272 ◽  
Author(s):  
X Sherry Liu ◽  
Emily M Stein ◽  
Bin Zhou ◽  
Chiyuan A Zhang ◽  
Thomas L Nickolas ◽  
...  
Keyword(s):  
Fragility Fractures ◽  
Element Analysis ◽  
Microfinite Element Analysis

scholarly journals Finite element analysis performed on radius and tibia HR-pQCT images and fragility fractures at all sites in men

2011 ◽  
Vol 26 (5) ◽  
pp. 965-973 ◽  
Author(s):  
Nicolas Vilayphiou ◽  
Stephanie Boutroy ◽  
Pawel Szulc ◽  
Bert van Rietbergen ◽  
Francoise Munoz ◽  
...  
Keyword(s):  
Finite Element Analysis ◽  
Finite Element ◽  
Fragility Fractures ◽  
Element Analysis

Finite element analysis performed on radius and tibia HR-pQCT images and fragility fractures at all sites in postmenopausal women

Bone ◽  
2010 ◽  
Vol 46 (4) ◽  
pp. 1030-1037 ◽  
Author(s):  
Nicolas Vilayphiou ◽  
Stephanie Boutroy ◽  
Elisabeth Sornay-rendu ◽  
Bert Van rietbergen ◽  
Francoise Munoz ◽  
...  
Keyword(s):  
Finite Element Analysis ◽  
Finite Element ◽  
Postmenopausal Women ◽  
Fragility Fractures ◽  
Element Analysis

Computer programs for the calculation of x-ray intensities emitted by elements in multi-layer structures

1990 ◽  
Vol 48 (2) ◽  
pp. 216-217
Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers ◽  
J.M. Dijkstra
Keyword(s):  
Software Package ◽  
Light Element ◽  
Matrix Correction ◽  
Excellent Performance ◽  
Element Analysis ◽  
X Ray ◽  
Know How ◽  
Accurate Knowledge ◽  
Layer Structures ◽  
Bulk Matrix

For the calculation of X-ray intensities emitted by elements present in multi-layer systems it is vital to have an accurate knowledge of the x-ray ionization vs. mass-depth (ϕ(ρz)) curves as a function of accelerating voltage and atomic number of films and substrate. Once this knowledge is available the way is open to the analysis of thin films in which both the thicknesses as well as the compositions can usually be determined simultaneously.Our bulk matrix correction “PROZA” with its proven excellent performance for a wide variety of applications (e.g., ultra-light element analysis, extremes in accelerating voltage) has been used as the basis for the development of the software package discussed here. The PROZA program is based on our own modifications of the surface-centred Gaussian ϕ(ρz) model, originally introduced by Packwood and Brown. For its extension towards thin film applications it is required to know how the 4 Gaussian parameters α, β, γ and ϕ(o) for each element in each of the films are affected by the film thickness and the presence of other layers and the substrate.

An improved interference correction for trace element analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1646-1647
Author(s):  
John J. Donovan ◽  
Donald A. Snyder ◽  
Mark L. Rivers
Keyword(s):  
Trace Element Analysis ◽  
Accurate Estimate ◽  
Simple Expression ◽  
Standard Reference Materials ◽  
Characteristic Line ◽  
Analytical Line ◽  
Element Analysis ◽  
Electron Probe Analysis ◽  
Calculated Concentration ◽  
X Ray

We present a simple expression for the quantitative treatment of interference corrections in x-ray analysis. WDS electron probe analysis of standard reference materials illustrate the success of the technique.For the analytical line of wavelength λ of any element A which lies near or on any characteristic line of another element B, the observed x-ray counts at We use to denote x-ray counts excited by element i in matrix j (u=unknown; s=analytical standard; ŝ=interference standard) at the wavelength of the analytical line of A, λA (Fig. 1). Quantitative analysis of A requires an accurate estimate of These counts can be estimated from the ZAF calculated concentration of B in the unknown C,Bu measured counts at λA in an interference standard of known concentration of B (and containing no A), and ZAF correction parameters for the matrices of both the unknown and the interference standard at It can be shown that:

The Influence of Specimen Thickness in Quantitative Electron Energy Loss Spectroscopy

1980 ◽  
Vol 38 ◽  
pp. 112-113
Author(s):  
Nestor J. Zaluzec
Keyword(s):  
Quantitative Analysis ◽  
Adverse Effects ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Materials Science ◽  
Light Element ◽  
Specimen Thickness ◽  
Element Analysis ◽  
Electron Energy Loss

The application of electron energy loss spectroscopy (EELS) to light element analysis is rapidly becoming an important aspect of the microcharacterization of solids in materials science, however relatively stringent requirements exist on the specimen thickness under which one can obtain EELS data due to the adverse effects of multiple inelastic scattering.1,2 This study was initiated to determine the limitations on quantitative analysis of EELS data due to specimen thickness.

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