High-voltage electron microscopy and conventional transmission electron microscopy of the interface zone between bone and endosteal dental implants

1992 ◽  
Vol 26 (4) ◽  
pp. 529-545 ◽  
Author(s):  
D. E. Steflik ◽  
A. L. Sisk ◽  
G. R. Parr ◽  
P. J. Hanes ◽  
F. Lake ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dental Implants ◽  
High Voltage ◽  
High Voltage Electron Microscopy ◽  
Interface Zone ◽  
Conventional Transmission Electron Microscopy ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Transmission Electron

Observations on Developing Blood Vessels in Rat Spinal Cord—A High Voltage Electron Microscopy Study

1974 ◽  
Vol 32 ◽  
pp. 66-67
Author(s):  
Richard S. Hannah
Keyword(s):  
Electron Microscopy ◽  
Spinal Cord ◽  
High Voltage ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
High Voltage Electron Microscopy ◽  
Thin Sections ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Transmission Electron

The formation of junctional complexes between endothelial cell processes was examined in rat spinal cords, from age birth to six weeks. Segments of spinal cord were removed from the region of the cervical enlargement and fixed. For comparative purposes, animals from each time group were subdivided into groups, fixed by either immersion or perfusion with an aldehyde combination in sodium cacodylate buffer and embedded in Araldite. Thin sections were examined by conventional transmission electron microscopy. Thick sections (0.5μ - 1.0μ) were stained with uranyl magnesium acetate for four hours at 60°C and lead citrate for 30 mins. and examined in the AEI Mark II High Voltage Electron Microscope.

Detection efficiency and estimation of the performance of high voltage STEM

1978 ◽  
Vol 36 (1) ◽  
pp. 84-85
Author(s):  
A. Ishikawa ◽  
C. Morita ◽  
M. Hibino ◽  
S. Maruse
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Radiation Damage ◽  
High Voltage ◽  
Detection Efficiency ◽  
Beam Current ◽  
High Energy ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
Transmission Electron

One of the problems which are met in conventional transmission electron microscopy (CTEM) at high voltages is the reduction of the sensitivity of photographic films for high energy electron beams, resulting in the necessity of using high beam current. This cancels out an advantage of high voltage electron microscopy which is otherwise expected from the reduction of the inelastic scattering in the specimen, that is the reduced radiation damage of the specimen during observations. However, it is expected that the efficiency of the detector of scanning transmission electron microscopy (STEM) can be superior to that of CTEM, since the divergence of the electron beam in the detecting material does not affect the quality of the image. In addition to observation with less radiation damage, high voltage STEM with high detection efficiency is very attractive for observations of weak contrast objects since the enhancement of the contrast (which is an important advantage of STEM) is easily realized electrically.

HVEM studies of the calcified bone interface with endosteal dental implants

1991 ◽  
Vol 49 ◽  
pp. 36-37
Author(s):  
D. E. Steflik ◽  
M. J. Song ◽  
A. L. Sjsk ◽  
G. R. Parr ◽  
P. J. Hanes ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Dental Implants ◽  
High Voltage ◽  
High Voltage Electron Microscopy ◽  
Bone Interface ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Conventional Electron Microscopy

Previous studies have suggested the prerequisite of bone interfacing successful endosteal dental implants. This is the concept of osseointegration of dental implants within the jaw. However, the ultrastructure of the actual bone interface is largely unknown. This current study is planned to elucidate with correlative high-voltage electron microscopy (HVEM) and conventional electron microscopy (TEM), the morphology of the interface of the support tissues to endosteal dental implants. All ultrastructural protocols involve undecalcified tissue sectioning.After 2 months healing following extraction of all premolars, 120 root form and blade-type endosteal dental implants were placed into the mandibles of 30 adult mongrel dogs. This report will be restricted to 12 implants retrieved from animals euthanized after 5 months of unloaded healing. Following perfusion with buffered 3% glutaraldehyde the implants were block resected with their encasement of mandibular tissues, fixed by immersion for 24 hr in glutaraldehyde and postfixed with 1% OsO4 for 2 hr.

Development of Field Emission Gun for High Voltage Electron Microscope

1990 ◽  
Vol 48 (1) ◽  
pp. 604-605
Author(s):  
H. Shimoyama ◽  
C. Morita ◽  
S. Arai ◽  
N. Yokoi ◽  
K. Miyauchi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Field Emission ◽  
High Voltage ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Transmission Electron ◽  
Scanning Transmission

For the last few years we have been developing a field emission (FE) gun system for our high voltage electron microscope (HVEM) H-1250 ST (maximum accelerating voltage of 1.25 MV) at Nagoya University, in order to attain much higher level of performance of the instrument and to exploit further extended field of application. In the first stage of the project during the period from 1986 to 1987, the FE gun system had been mounted on the top of the accelerating tube, and successfully been operated at the accelerating voltage of 1 MV for the first time pin the world. The operation was very stable and high resolution images for both scanning transmission electron microscopy (STEM) and conventional transmission electron microscopy (CTEM) modes were possible at this stage. At the same time, however, several practical problems related to incorporating the FE gun into the HVEM were made clear. Since then several important modifications on instrumentation and electronics have been made and the project is now at the second stage. In this paper a brief outline of the FE gun system developed for our HVEM is described especially from the view point of instrumentation and electronics.

The bone-dental implant interface: HVEM and TEM observations

1992 ◽  
Vol 50 (1) ◽  
pp. 918-919
Author(s):  
D.E. Steflik ◽  
D.J. Berkery ◽  
G.R. Parr ◽  
A.L. Sisk ◽  
P.J. Hanes ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Dental Implants ◽  
Dental Implant ◽  
High Voltage ◽  
Ultrastructural Level ◽  
High Voltage Electron Microscopy ◽  
Bone Interface ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Conventional Electron Microscopy

Previous studies have suggested the prerequisite of bone interfacing successful endosteal dental implants. This is the concept of osseointegration of dental implants within the jaw. However, the morphology of the actual bone interface on the ultrastructural level is lacking. This current study attempts to elucidate, with correlative high voltage electron microscopy (HVEM) and conventional electron microscopy (TEM), the morphology of the bone-dental implant interface.

High Voltage Electron Microscopy of Ion-Milled Dental Enamel

1974 ◽  
Vol 32 ◽  
pp. 60-61
Author(s):  
L. D. Ackerman ◽  
S. H. Y. Wei
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Third Molar ◽  
Polarized Light ◽  
Dental Enamel ◽  
Longitudinal Section ◽  
Ion Milling ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
High Voltage Electron

Mature human dental enamel has presented investigators with several difficulties in ultramicrotomy of specimens for electron microscopy due to its high degree of mineralization. This study explores the possibility of combining ion-milling and high voltage electron microscopy as a means of circumventing the problems of ultramicrotomy.A longitudinal section of an extracted human third molar was ground to a thickness of about 30 um and polarized light micrographs were taken. The specimen was attached to a single hole grid and thinned by argon-ion bombardment at 15° incidence while rotating at 15 rpm. The beam current in each of two guns was 50 μA with an accelerating voltage of 4 kV. A 20 nm carbon coating was evaporated onto the specimen to prevent an electron charge from building up during electron microscopy.

Three-Dimensional Visualization of the T-System of Frog Muscle Using High Voltage Electron Microscopy and a Lanthanum Stain

1977 ◽  
Vol 35 ◽  
pp. 570-571 ◽  
Author(s):  
Lee D. Peachey ◽  
Clara Franzini-Armstrong
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Three Dimensional ◽  
Biological Tissues ◽  
High Voltage Electron Microscopy ◽  
Transverse Tubular System ◽  
Peroxidase Reaction ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
T System

The effective study of biological tissues in thick slices of embedded material by high voltage electron microscopy (HVEM) requires highly selective staining of those structures to be visualized so that they are not hidden or obscured by other structures in the image. A tilt pair of micrographs with subsequent stereoscopic viewing can be an important aid in three-dimensional visualization of these images, once an appropriate stain has been found. The peroxidase reaction has been used for this purpose in visualizing the T-system (transverse tubular system) of frog skeletal muscle by HVEM (1). We have found infiltration with lanthanum hydroxide to be particularly useful for three-dimensional visualization of certain aspects of the structure of the T- system in skeletal muscles of the frog. Specifically, lanthanum more completely fills the lumen of the tubules and is denser than the peroxidase reaction product.

Radiation-Induced Precipitation at Thin Foil Surfaces in Ni-Be Alloys

1982 ◽  
Vol 40 ◽  
pp. 598-599
Author(s):  
T. Mukai ◽  
T. E. Mitchell
Keyword(s):  
Electron Microscopy ◽  
High Voltage ◽  
Electron Irradiation ◽  
High Vacuum ◽  
Thin Foil ◽  
Homogeneous Precipitation ◽  
High Voltage Electron Microscopy ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Radiation Induced

Radiation-induced homogeneous precipitation in Ni-Be alloys was recently observed by high voltage electron microscopy. A coupling of interstitial flux with solute Be atoms is responsible for the precipitation. The present investigation further shows that precipitation is also induced at thin foil surfaces by electron irradiation under a high vacuum.

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