High-resolution computer simulation of electrophoretic mobilization in isoelectric focusing

2008 ◽  
Vol 29 (8) ◽  
pp. 1676-1686 ◽  
Author(s):  
Wolfgang Thormann ◽  
Richard A. Mosher
Keyword(s):  
Computer Simulation ◽  
High Resolution ◽  
Isoelectric Focusing

High-resolution computer simulation of the dynamics of isoelectric focusing of proteins

2004 ◽  
Vol 25 (2) ◽  
pp. 324-337 ◽  
Author(s):  
Wolfgang Thormann ◽  
Tiemin Huang ◽  
Janusz Pawliszyn ◽  
Richard A. Mosher
Keyword(s):  
Computer Simulation ◽  
High Resolution ◽  
Isoelectric Focusing

Characterization of Modulated Structure Through Structure Images and their Computer Simulation

1990 ◽  
Vol 48 (1) ◽  
pp. 70-71
Author(s):  
Kiyomichi Nakai ◽  
Yusuke Isobe ◽  
Chiken Kinoshita ◽  
Kazutoshi Shinohara
Keyword(s):  
Computer Simulation ◽  
High Resolution ◽  
Spherical Aberration ◽  
High Resolution Electron Microscopy ◽  
Basic Mechanism ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Transmitted Beam ◽  
Modulated Structure ◽  
Resolution Electron

Induced spinodal decomposition under electron irradiation in a Ni-Au alloy has been investigated with respect to its basic mechanism and confirmed to be caused by the relaxation of coherent strain associated with modulated structure. Modulation of white-dots on structure images of modulated structure due to high-resolution electron microscopy is reduced with irradiation. In this paper the atom arrangement of the modulated structure is confirmed with computer simulation on the structure images, and the relaxation of the coherent strain is concluded to be due to the reduction of phase-modulation.Structure images of three-dimensional modulated structure along <100> were taken with the JEM-4000EX high-resolution electron microscope at the HVEM Laboratory, Kyushu University. The transmitted beam and four 200 reflections with their satellites from the modulated structure in an fee Ni-30.0at%Au alloy under illumination of 400keV electrons were used for the structure images under a condition of the spherical aberration constant of the objective lens, Cs = 1mm, the divergence of the beam, α = 3 × 10-4 rad, underfocus, Δf ≃ -50nm and specimen thickness, t ≃ 15nm. The CIHRTEM code was used for the simulation of the structure image.

High resolution preparative isoelectric focusing in layers of granulated gels

1982 ◽  
Vol 3 (4) ◽  
pp. 216-226 ◽  
Author(s):  
Manuela D. Frey ◽  
Bertold J. Radola
Keyword(s):  
High Resolution ◽  
Isoelectric Focusing
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