BAST: BIST-aided scan test. A new method for test cost reduction

2007 ◽  
Vol 90 (5) ◽  
pp. 58-65
Author(s):  
Takashi Aikyo ◽  
Takahisa Hiraide ◽  
Michiaki Emori
Keyword(s):  
Cost Reduction ◽  
New Method ◽  
Test Cost ◽  
Scan Test ◽  
Test Cost Reduction

BIST-aided scan test - a new method for test cost reduction

2003 ◽  
Author(s):  
T. Hiraide ◽  
Kwame Osei Boateng ◽  
H. Konishi ◽  
K. Itaya ◽  
M. Emori ◽  
...  
Keyword(s):  
Cost Reduction ◽  
New Method ◽  
Test Cost ◽  
Scan Test ◽  
Test Cost Reduction

Reduced-Pin-Count BOST for Test-Cost Reduction

2021 ◽  
pp. 1-1
Author(s):  
Youngkwang Lee ◽  
Young-woo Lee ◽  
Sungyoul Seo ◽  
Sungho Kang
Keyword(s):  
Cost Reduction ◽  
Test Cost ◽  
Test Cost Reduction

Reliable test architecture with test cost reduction for systolic based DNN accelerators

2021 ◽  
pp. 1-1
Author(s):  
Muhammad Ibtesam ◽  
Umair Saeed Solangi ◽  
Jinuk Kim ◽  
Muhammad Adil Ansari ◽  
Sungju Park
Keyword(s):  
Cost Reduction ◽  
Test Cost ◽  
Reliable Test ◽  
Test Cost Reduction ◽  
Test Architecture

scholarly journals A scan disabling-based BAST scheme for test cost reduction

2011 ◽  
Vol 8 (16) ◽  
pp. 1367-1373 ◽  
Author(s):  
Zhiqiang You ◽  
Weizheng Wang ◽  
Zhiping Dou ◽  
Peng Liu ◽  
Jishun Kuang
Keyword(s):  
Cost Reduction ◽  
Test Cost ◽  
Test Cost Reduction
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