scholarly journals Semi‐automated background removal limits data loss and normalises imaging mass cytometry data

2021 ◽  
Author(s):  
Marieke E. Ijsselsteijn ◽  
Antonios Somarakis ◽  
Boudewijn P. F. Lelieveldt ◽  
Thomas Höllt ◽  
Noel F. C. C. de Miranda
2020 ◽  
Author(s):  
Marieke E. Ijsselsteijn ◽  
Antonios Somarakis ◽  
Boudewijn P.F. Lelieveldt ◽  
Thomas Hollt ◽  
Noel F.C.C. de Miranda

AbstractImaging mass cytometry (IMC) allows the detection of multiple antigens (approximately 40 markers) combined with spatial information, making it a unique tool for the evaluation of complex biological systems. Due to its widespread availability and retained tissue morphology, formalin-fixed, paraffin-embedded (FFPE) tissues are often a material of choice for IMC studies. However, antibody performance and signal-to-noise ratio can differ considerably between FFPE tissues as a consequence of variations in tissue processing, including fixation. We investigated the effect of immunodetection-related signal intensity fluctuations on IMC analysis and phenotype identification in a cohort of twelve colorectal cancer tissues. Furthermore, we explored different normalisation strategies and propose a workflow to normalise IMC data by semi-automated background removal, using publicly available tools. This workflow can be directly applied to previously obtained datasets and considerably improves the quality of IMC data, thereby supporting the analysis and comparison of multiple samples.


Author(s):  
SM Solberg ◽  
AK Aarebrot ◽  
I Sarkar ◽  
A Petrovic ◽  
LF Sandvik ◽  
...  

Author(s):  
Rajesh Medikonduri

Abstract This paper discusses the physics, definitions, and nanoprobing flow of a flash bit memory. In addition, a case study showing the effectiveness of nanoprobing in detecting the Single Bit Fail Data Gain and Data Loss in Flash Memory is also discussed. The paper also includes cases where no passive voltage contrast was observed at the SEM and no leakage was observed at AFM, yet the units failing SBF DG, SBF DL and depletion, were detected by nanoprobing of the single bit. The major finding of this paper is a way to resolve data gain, data loss, and depletion failures of flash memory by nanoprobing procedure, despite no PVC seen at the SEM and no leakage seen at the AFM.


Author(s):  
Vincenzo Zeno-Zencovich
Keyword(s):  

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