Some fundamental properties of second-order activeRC filters with composite operational amplifiers

1989 ◽  
Vol 17 (4) ◽  
pp. 375-396
Author(s):  
Aleksander Urbaś ◽  
Jerzy Osiowski
Keyword(s):  
Second Order ◽  
Operational Amplifiers ◽  
Fundamental Properties

A new second-order multifunctional RC-active filter circuit using two operational amplifiers

1980 ◽  
Vol 100 (1) ◽  
pp. 117-122
Author(s):  
Takahiro Inouye ◽  
Fumio Ueno ◽  
Hiroo Okamoto
Keyword(s):  
Active Filter ◽  
Second Order ◽  
Operational Amplifiers

scholarly journals On (L,M)-Double Fuzzy Filter Spaces

2018 ◽  
Vol 2018 ◽  
pp. 1-15
Author(s):  
A. A. Abd El-Latif ◽  
H. Aygün ◽  
V. Çetkin
Keyword(s):  
Second Order ◽  
Fuzzy Filter ◽  
Topological Category ◽  
Filter Base ◽  
Fundamental Properties ◽  
Filter Structures ◽  
The Given ◽  
Order Image

We give in this paper the definitions of (L,M)-double fuzzy filter base and (L,M)-double fuzzy filter structures where L and M are strictly two-sided commutative quantales, and we also investigate the relations between them. Moreover, we propose second-order image and preimage operators of (L,M)-double fuzzy filter base and study some of its fundamental properties. Finally, we handle the given structures in the categorical aspect. For instance, we show that the category (L,M)-DFIL of (L,M)-double fuzzy filter spaces and filter maps between these spaces is a topological category over the category SET.

scholarly journals Horadam Octonions

2017 ◽  
Vol 25 (3) ◽  
pp. 97-106 ◽  
Author(s):  
Adnan Karataş ◽  
Serpil Halici
Keyword(s):  
Generating Function ◽  
Recurrence Relations ◽  
Second Order ◽  
Fundamental Properties

Abstract In this paper, first we define Horadam octonions by Horadam sequence which is a generalization of second order recurrence relations. Also, we give some fundamental properties involving the elements of that sequence. Then, we obtain their Binet-like formula, ordinary generating function and Cassini identity.

Equivalence and symmetries of second-order differential equations

2008 ◽  
Vol 58 (5) ◽  
Author(s):  
V. Tryhuk ◽  
O. Dlouhý
Keyword(s):  
Differential Geometry ◽  
Differential Equations ◽  
Differential Forms ◽  
Second Order ◽  
Fundamental Properties ◽  
Second Order Differential Equations ◽  
The Common ◽  
Differential Equations With Deviations ◽  
Direct Calculations

AbstractIn this article we investigate the equivalence of underdetermined differential equations and differential equations with deviations of second order with respect to the pseudogroup of transformations $$ \bar x $$ = φ(x), ȳ = ȳ($$ \bar x $$) = L(x) + y(x), $$ \bar z $$ = $$ \bar z $$($$ \bar x $$) = M(x) + z(x). Our main aim is to determine such equations that admit a large pseudogroup of symmetries. Instead the common direct calculations, we use some more advanced tools from differential geometry, however, our exposition is self-contained and only the most fundamental properties of differential forms are employed.

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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