An accurate and simplified small signal parameter extraction method for GaN HEMT

2019 ◽  
Vol 47 (6) ◽  
pp. 941-953 ◽  
Author(s):  
Ahmad Khusro ◽  
Mohammad S. Hashmi ◽  
Abdul Quaiyum Ansari ◽  
Aditya Mishra ◽  
Mohammad Tarique
2021 ◽  
pp. 108228
Author(s):  
Shaowei Wang ◽  
Jincan Zhang ◽  
Na Li ◽  
Min Liu ◽  
Bo Liu ◽  
...  

2013 ◽  
Vol 690-693 ◽  
pp. 564-568
Author(s):  
Xiao Wei Zhang ◽  
Peng Xu ◽  
Ke Jin Jia ◽  
Zhi Hong Feng ◽  
Zheng Ping Zhao

We use S-Parameter Methodto extract device parameter of InAlN/GaN HEMT in this paper. We find thatparasitic capacitance and parasitic inductance can be extracted in traditionaltest structure method, but do nothing about parasitic resistor. Cold parameter methodcan extract parasitic resistor efficiently, but there is greater error inparasitic capacitance and parasitic inductance extraction. We propose a methodwhich combines test structure method and cold parameter method to extract parasitic parameteraccurately. We can acquire intrinsic parameters through getting rid ofparasitism parameters, and can fitting test outcome satisfactorily. It canreflect accurately the physical characteristics of GaN HEMT devices, and givesfeedback and guidance to device technology at the same time.


Author(s):  
Yongbo Chen ◽  
Yuehang Xu ◽  
Feng Wang ◽  
Changsi Wang ◽  
Qingzhi Wu ◽  
...  

2005 ◽  
Vol 10 (2) ◽  
pp. 405-409
Author(s):  
Shi Xin-zhi ◽  
Liu Hai-wen ◽  
Sun Xiao-wei ◽  
Che Yan-feng ◽  
Cheng Zhi-qun ◽  
...  

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