Power packet dispatching with second-order clock synchronization

2015 ◽  
Vol 44 (3) ◽  
pp. 729-743 ◽  
Author(s):  
Yanzi Zhou ◽  
Ryo Takahashi ◽  
Naoaki Fujii ◽  
Takashi Hikihara
Keyword(s):  
Clock Synchronization ◽  
Second Order

Clock synchronization through second order coherence of thermal light

2011 ◽  
Author(s):  
Jun Zhu ◽  
Yuan Lu ◽  
Peng Huang ◽  
Jingneng Liu ◽  
Guihua Zeng ◽  
...  
Keyword(s):  
Clock Synchronization ◽  
Second Order ◽  
Thermal Light

Simulation and realization of a second-order quantum-interference-based quantum clock synchronization at the femtosecond level

2019 ◽  
Vol 44 (3) ◽  
pp. 614 ◽  
Author(s):  
Runai Quan ◽  
Ruifang Dong ◽  
Yiwei Zhai ◽  
Feiyan Hou ◽  
Xiao Xiang ◽  
...  
Keyword(s):  
Quantum Interference ◽  
Clock Synchronization ◽  
Second Order

Realization of Sub-picosecond Clock Synchronization based on Second-Order Quantum Coherence

CLEO: 2015 ◽  
2015 ◽  
Author(s):  
Runai Quan ◽  
Ruifang Dong ◽  
Yiwei Zhai ◽  
Mengmeng Wang ◽  
Shaofeng Wang ◽  
...  
Keyword(s):  
Quantum Coherence ◽  
Clock Synchronization ◽  
Second Order

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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