On the possibility of application of x-ray diffraction edge contrast for the quantitative determination of high-energy heavy ion range in silicon

1988 ◽  
Vol 23 (1) ◽  
pp. K20-K24 ◽  
Author(s):  
J. Auleytner ◽  
J. Bak-Misiuk ◽  
Z. Furmanik ◽  
J. Morawiec
Keyword(s):  
Quantitative Determination ◽  
Heavy Ion ◽  
High Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Edge Contrast

Quantitative determination of fragmentation kinetics and thermodynamics of colloidal silver nanowires by in situ high-energy synchrotron X-ray diffraction

Nanoscale ◽  
2014 ◽  
Vol 6 (1) ◽  
pp. 365-370 ◽  
Author(s):  
Zheng Li ◽  
John S. Okasinski ◽  
Jonathan D. Almer ◽  
Yang Ren ◽  
Xiaobing Zuo ◽  
...  
Keyword(s):  
Quantitative Determination ◽  
Silver Nanowires ◽  
High Energy ◽  
Colloidal Silver ◽  
X Ray Diffraction ◽  
Kinetics And Thermodynamics ◽  
X Ray

X-ray diffraction cell for studying solid–gas reactions under gas pressures to 100 bar

2006 ◽  
Vol 39 (6) ◽  
pp. 850-855 ◽  
Author(s):  
E. MacA. Gray ◽  
D. J. Cookson ◽  
T. P. Blach
Keyword(s):  
Phase Transformation ◽  
Heat Flow ◽  
Real Time ◽  
High Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Time Determination ◽  
Gas Reactions ◽  
Gas Pressures

A pressure cell designed for high-energy X-ray diffraction in transmission mode is described. The cell is intended for use at temperatures up to 573 K with samples that are large enough to permit the real-time determination of the amount of absorbed gas by measuring the gas pressure. The design is driven by the need to ensure that the sample temperature is constant and uniform, despite the heat flow accompanying the reaction between the gas and the sample. The use of the cell is illustrated by its application to elucidating the hydriding phase transformation in the LaNi5–H2system.

Experimental determination of residual stress in silicon nitride diffusion bonds obtained by high-energy X-ray diffraction

2004 ◽  
Vol 148 (1) ◽  
pp. 60-63 ◽  
Author(s):  
M. Vila ◽  
M.L. Martínez ◽  
C. Prieto ◽  
P. Miranzo ◽  
M.I. Osendi ◽  
...  
Keyword(s):  
Residual Stress ◽  
Silicon Nitride ◽  
Experimental Determination ◽  
High Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffusion Bonds

scholarly journals Quantitative Determination of Preferred Orientation by Energy-Dispersive X-Ray Diffraction

1976 ◽  
Vol 2 (2) ◽  
pp. 95-111 ◽  
Author(s):  
L. Gerward ◽  
S. Lehn ◽  
G. Christiansen
Keyword(s):  
Quantitative Determination ◽  
Rolling Texture ◽  
Tension Test ◽  
Preferred Orientation ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fibre Texture

The use of energy-dispersive X-ray diffraction for quantitative determination of preferred orientations in polycrystalline specimens is analysed. The method is applied to determinations of rolling texture and fibre texture. The adaptability of the method to in situ studies is demonstrated by observations of texture changes simultaneous with the deformation of a specimen in a tension test.

Sign in / Sign up

Export Citation Format

Share Document