Investigation for ferroelectric domains by scanning electron microscopy

1985 ◽  
Vol 20 (11) ◽  
pp. 1489-1494 ◽  
Author(s):  
A. Röder ◽  
C. Scheiding
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Ferroelectric Domains ◽  
Scanning Electron

scholarly journals Dielectric Anisotropy in Partially Grain-Oriented Bi2VO5.5Ceramics

1995 ◽  
Vol 18 (3) ◽  
pp. 137-144 ◽  
Author(s):  
K. V. R. Prasad ◽  
K. B. R. Varma
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Grain Orientation ◽  
Hysteresis Loops ◽  
Dielectric Constants ◽  
Dielectric Anisotropy ◽  
Ferroelectric Domains ◽  
Ferroelectric Hysteresis ◽  
Microstructural Studies ◽  
Scanning Electron

Ceramics obtained from quenching melts of prereacted polycrystalline Bi2V5.5exhibit grain orientation (~ 55%). Microstructural studies carried out using scanning electron microscopy (SEM) on subsequently annealed ceramics show ferroelectric domains. These post-annealed ceramics possess dielectric anisotropies of about 1:1.2 at 300 K and 1:4.3 in the vicinity of the Curie temperature (~ 730 K) between the directions parallel and perpendicular to the quenching direction. The dielectric constants of the samples, obtained by quenching the melts, are higher than that of the post-annealed ceramics. Electrically poled and thermally cycled samples of both as-quenched and post-annealed exhibit ferroelectric hysteresis loops at 300 K.

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