Far- and Deep-UV Spectroscopy of Semiconductor Nanoparticles Measured Based on Attenuated Total Reflectance spectroscopy

ChemPhysChem ◽  
2016 ◽  
Vol 17 (4) ◽  
pp. 516-519 ◽  
Author(s):  
Ichiro Tanabe ◽  
Yosuke Yamada ◽  
Yukihiro Ozaki
Sign in / Sign up

Export Citation Format

Share Document