3He Impurities in Nearly Frictionless Transport of Solid 4He at Low Temperatures

ChemPhysChem ◽  
2010 ◽  
Vol 11 (16) ◽  
pp. 3485-3490 ◽  
Author(s):  
Kwang-Hua W. Chu
Keyword(s):  
Low Temperatures ◽  
Solid 4He ◽  
3He Impurities

Deformation kinetics within cylindrical micropores of glassy solid 4He at very low temperatures

2009 ◽  
Vol 18 (2-3) ◽  
pp. 114-126
Author(s):  
Chu Z. K.-H. ◽  
S.-J. Liu ◽  
C. Qin
Keyword(s):  
Low Temperatures ◽  
Solid 4He ◽  
Deformation Kinetics

The Effect of 3He Impurities on Anomalous Oscillations in the Expansion of Solid 4He

2007 ◽  
Vol 146 (3-4) ◽  
pp. 393-402 ◽  
Author(s):  
G. Benedek ◽  
R. E. Grisenti ◽  
M. Käsz ◽  
J. P. Toennies
Keyword(s):  
Solid 4He ◽  
3He Impurities

Lattice Relaxation in Solid 4He: Effect on Dynamics of 3He Impurities

2013 ◽  
Vol 175 (1-2) ◽  
pp. 133-139 ◽  
Author(s):  
N. S. Sullivan ◽  
D. Candela ◽  
S. S. Kim ◽  
C. Huan ◽  
L. Yin ◽  
...  
Keyword(s):  
Lattice Relaxation ◽  
Solid 4He ◽  
3He Impurities

Plastic Flow of Solid 4He and 3He at Low Temperatures (Review Article)

2019 ◽  
Vol 45 (9) ◽  
pp. 964-974
Author(s):  
V. A. Maidanov ◽  
E. Ya. Rudavskii ◽  
S. N. Smirnov ◽  
S. S. Sokolov
Keyword(s):  
Plastic Flow ◽  
Low Temperatures ◽  
Review Article ◽  
Solid 4He

Measurements of the Specific Heat of Liquid and Solid 4He in a Confined Geometry at Low Temperatures

1980 ◽  
pp. 169-172 ◽  
Author(s):  
B. Hébral ◽  
G. Frossati ◽  
H. Godfrin ◽  
D. Thoulouze ◽  
A. S. Greenberg
Keyword(s):  
Specific Heat ◽  
Low Temperatures ◽  
Solid 4He ◽  
Confined Geometry

Spin diffusion of 3He impurities in solid 4He

Physica B+C ◽  
1976 ◽  
Vol 82 (2) ◽  
pp. 321-329
Author(s):  
Satish Kumar Muthu ◽  
Daljeet Singh Manhas
Keyword(s):  
Spin Diffusion ◽  
Solid 4He ◽  
3He Impurities

Interpretation of irradiation-induced changes in electron diffractograms and images of extinction contours at low temperatures

1984 ◽  
Vol 42 ◽  
pp. 268-269
Author(s):  
E. Knapek ◽  
H. Formanek ◽  
G. Lefranc ◽  
I. Dietrich
Keyword(s):  
Low Temperatures ◽  
Carbon Films ◽  
Organic Crystals ◽  
Wide Spread ◽  
Lens System ◽  
Preparation Conditions ◽  
Thin Carbon ◽  
Electron Diffractograms ◽  
Diffraction Patterns ◽  
Induced Changes

A few years ago results on cryoprotection of L-valine were reported, where the values of the critical fluence De i.e, the electron exposure which decreases the intensity of the diffraction reflections by a factor e, amounted to the order of 2000 + 1000 e/nm2. In the meantime a discrepancy arose, since several groups published De values between 100 e/nm2 and 1200 e/nm2 /1 - 4/. This disagreement and particularly the wide spread of the results induced us to investigate more thoroughly the behaviour of organic crystals at very low temperatures during electron irradiation.For this purpose large L-valine crystals with homogenuous thickness were deposited on holey carbon films, thin carbon films or Au-coated holey carbon films. These specimens were cooled down to nearly liquid helium temperature in an electron microscope with a superconducting lens system and irradiated with 200 keU-electrons. The progress of radiation damage under different preparation conditions has been observed with series of electron diffraction patterns and direct images of extinction contours.

Radiation Damage of Support Films

1981 ◽  
Vol 39 ◽  
pp. 28-29
Author(s):  
H.A. Cohen ◽  
W. Chiu
Keyword(s):  
Transfer Function ◽  
Low Temperatures ◽  
Carbon Support ◽  
Contrast Transfer Function ◽  
Electron Dose ◽  
Imaging Parameters ◽  
Negative Stain ◽  
Phase Corrections ◽  
Two Parameters ◽  
Medium Dose

The goal of imaging the finest detail possible in biological specimens leads to contradictory requirements for the choice of an electron dose. The dose should be as low as possible to minimize object damage, yet as high as possible to optimize image statistics. For specimens that are protected by low temperatures or for which the low resolution associated with negative stain is acceptable, the first condition may be partially relaxed, allowing the use of (for example) 6 to 10 e/Å2. However, this medium dose is marginal for obtaining the contrast transfer function (CTF) of the microscope, which is necessary to allow phase corrections to the image. We have explored two parameters that affect the CTF under medium dose conditions.Figure 1 displays the CTF for carbon (C, row 1) and triafol plus carbon (T+C, row 2). For any column, the images to which the CTF correspond were from a carbon covered hole (C) and the adjacent triafol plus carbon support film (T+C), both recorded on the same micrograph; therefore the imaging parameters of defocus, illumination angle, and electron statistics were identical.

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