Local Work Function Differences at Line Defects in Aluminium Oxide on NiAl(110)

ChemPhysChem ◽  
2010 ◽  
Vol 11 (10) ◽  
pp. 2085-2087 ◽  
Author(s):  
Lars Heinke ◽  
Leonid Lichtenstein ◽  
Georg H. Simon ◽  
Thomas König ◽  
Markus Heyde ◽  
...  
Keyword(s):  
Work Function ◽  
Aluminium Oxide ◽  
Line Defects ◽  
Local Work

Image states and local work function for Ag/Pd(111)

1993 ◽  
Vol 70 (5) ◽  
pp. 654-657 ◽  
Author(s):  
R. Fischer ◽  
S. Schuppler ◽  
N. Fischer ◽  
Th. Fauster ◽  
W. Steinmann
Keyword(s):  
Work Function ◽  
Image States ◽  
Local Work

Optical band gap, local work function and field emission properties of MBE grown β-MoO3 nanoribbons

2019 ◽  
Vol 476 ◽  
pp. 691-700 ◽  
Author(s):  
Paramita Maiti ◽  
Puspendu Guha ◽  
Ranveer Singh ◽  
Jatis Kumar Dash ◽  
Parlapalli V. Satyam
Keyword(s):  
Work Function ◽  
Band Gap ◽  
Field Emission ◽  
Optical Band Gap ◽  
Emission Properties ◽  
Field Emission Properties ◽  
Local Work

Micro Kelvin probe for local work‐function measurements

1988 ◽  
Vol 59 (5) ◽  
pp. 802-805 ◽  
Author(s):  
H. Baumgärtner ◽  
H. D. Liess
Keyword(s):  
Work Function ◽  
Kelvin Probe ◽  
Local Work

Local work function of a rutile TiO2()-(1×1) surface observed by Kelvin probe force microscopy

2003 ◽  
Vol 529 (1-2) ◽  
pp. L245-L250 ◽  
Author(s):  
Akira Sasahara ◽  
Hiroshi Uetsuka ◽  
Hiroshi Onishi
Keyword(s):  
Work Function ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Local Work

scholarly journals Local work function measurements of plasma-fluorinated epitaxial graphene

2014 ◽  
Vol 104 (8) ◽  
pp. 081607 ◽  
Author(s):  
Sonam D. Sherpa ◽  
Jan Kunc ◽  
Yike Hu ◽  
Galit Levitin ◽  
Walt A. de Heer ◽  
...  
Keyword(s):  
Work Function ◽  
Epitaxial Graphene ◽  
Local Work

scholarly journals Microconical Structure Formation and Field Emission From Atomically Heterogeneous Surfaces Created by Microwave Plasma–Based Low-Energy Ion Beams

2021 ◽  
Vol 9 ◽  
Author(s):  
Jayashree Majumdar ◽  
Sudeep Bhattacharjee
Keyword(s):  
Work Function ◽  
Field Emission ◽  
Enhancement Factor ◽  
Field Enhancement ◽  
Ion Beams ◽  
Emission Current ◽  
Force Microscopy ◽  
Field Emission Properties ◽  
Argon Ion ◽  
Local Work

We report the formation of self-organized microconical arrays on copper surface when exposed to high flux (5.4 × 1015 cm−2 s−1) of 2 keV argon ion beams at normal incidence. The created microconical arrays are explored for field emission properties. The surface morphologies are investigated by scanning electron microscopy and atomic force microscopy. The local work function variation is analyzed by Kelvin probe force microscopy, and the argon content in the irradiated layer is measured with X-ray Photoelectron Spectroscopy. The average aspect ratio (base width/height) of microstructures for individual irradiated samples is found to increase from 0.7 to 1.5 with a decrease in ion fluence. The ion concentration is highest (3.89 %) for a fluence of 4.7 × 1018 cm−2, which asserts the formation of atomically heterogeneous surface due to subsurface ion implantation. An enhancement in the field emission properties of the argon ion–treated copper substrates at a fluence of 4.7 × 1018 cm−2 with a low turn-on voltage of 2.33 kV and with electron emission current 0.5 nA has been observed. From the Fowler–Nordheim equations, the field enhancement factor is calculated to be 5,561 for pristine copper, which gets enhanced by a factor of 2–8 times for irradiated substrates. A parametric model is considered, by taking into account the modified local work function caused due to structural undulations of the microstructures and presence of implanted argon ions, for explaining the experimental results on the field enhancement factor and emission current.

scholarly journals Apparent tunneling barrier height and local work function of atomic arrays

2018 ◽  
Vol 9 ◽  
pp. 3048-3052
Author(s):  
Neda Noei ◽  
Alexander Weismann ◽  
Richard Berndt
Keyword(s):  
Work Function ◽  
Barrier Height ◽  
Tunneling Current ◽  
Scanning Tunneling ◽  
Local Surface ◽  
Tunneling Microscopy ◽  
Tunneling Barrier ◽  
Spatially Resolved ◽  
Lateral Extent ◽  
Local Work

Spatially resolved measurements of the apparent tunneling barrier height Φapp in scanning tunneling microscopy have been used to estimate variations of the local work function Φ of surface structures. We experimentally show that Φapp can fail as a measure of Φ. The discrepancies are attributed to a kinetic-energy contribution to Φapp. This contribution depends on the lateral extent of the tunneling current filament and, consequently, on the local surface structure.

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