Modeling of X-ray-Induced Refractive Index Changes in Poly(methyl methacrylate)

ChemPhysChem ◽  
2005 ◽  
Vol 6 (8) ◽  
pp. 1544-1553 ◽  
Author(s):  
Birk Andreas ◽  
Ingo Breunig ◽  
Karsten Buse
Keyword(s):  
Refractive Index ◽  
Methyl Methacrylate ◽  
X Ray ◽  
Poly Methyl Methacrylate ◽  
Index Changes

Properties of Carbon Nanofibers Prepared from Polyacrylonitrile/Poly(methyl Methacrylate) Blend

2009 ◽  
Vol 79-82 ◽  
pp. 353-356
Author(s):  
Wei Pan ◽  
Yan Chen ◽  
Xiao Wei He
Keyword(s):  
Methyl Methacrylate ◽  
Carbon Nanofibers ◽  
Carbon Fibers ◽  
Nitrogen Atmosphere ◽  
Wet Spinning ◽  
X Ray Diffraction ◽  
X Ray ◽  
Poly Methyl Methacrylate ◽  
Graphite Crystallite ◽  
Raman Microspectrometry

The polyacrylonitrile(PAN)/poly (methyl methacrylate)(PMMA) blend fibers were prepared by wet-spinning technique and carbonized over the temperature range of 400-1000°C in nitrogen atmosphere. After carbonization of the blend fibers, the PMMA component removed and the PAN component left in the form of carbon nanofibers. Morphology of the carbon nanofibers were investigated via scanning electron microscopy (SEM), and the carbonization behavior of the fibers were examined via x-ray diffraction (XRD), Raman microspectrometry. The optimal condition made carbon fibers with great L/D ratio and diameter less than 200 nm. XRD and Raman spectra shows that the PAN/PMMA blend fibers treated at 600°C produced some graphite crystallite.

Fabrication of Refractive Index Profiles in Poly (Methyl Methacrylate) using Ultraviolet Rays Irradiation

2002 ◽  
Vol 41 (Part 1, No. 2A) ◽  
pp. 876-880 ◽  
Author(s):  
Takeshi Kada ◽  
Takeyoshi Hiramatsu ◽  
Kenji Ogino ◽  
Chuang Xin Liang ◽  
Hideaki Machida ◽  
...  
Keyword(s):  
Refractive Index ◽  
Methyl Methacrylate ◽  
Ultraviolet Rays ◽  
Poly Methyl Methacrylate

Small-angle x-ray scattering investigation of poly(methyl methacrylate)-alumina nanocomposite

2019 ◽  
Author(s):  
Jitendra Bahadur ◽  
S. K. Sharma ◽  
Avik Das ◽  
Debasis Sen ◽  
P. K. Pujari
Keyword(s):  
Methyl Methacrylate ◽  
Small Angle ◽  
X Ray ◽  
Poly Methyl Methacrylate ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Effects of aryl substituents in N-acetyl-α-dehydroarylalanine naphthyl ester additive on the photoinduced refractive index change of poly(methyl methacrylate) film

2010 ◽  
Vol 42 (8) ◽  
pp. 670-675 ◽  
Author(s):  
Haruki Nakajima ◽  
Hiroshi Komatsu ◽  
Hitoe Iikura ◽  
Tetsutaro Igarashi ◽  
Tadamitsu Sakurai
Keyword(s):  
Refractive Index ◽  
Methyl Methacrylate ◽  
Refractive Index Change ◽  
Index Change ◽  
Poly Methyl Methacrylate

scholarly journals X-ray-Induced Production of Gold Nanoparticles on a SiO2/Si System and in a Poly(methyl methacrylate) Matrix

Langmuir ◽  
2005 ◽  
Vol 21 (1) ◽  
pp. 437-442 ◽  
Author(s):  
Ferdi Karadas ◽  
Gulay Ertas ◽  
Eda Ozkaraoglu ◽  
Sefik Suzer
Keyword(s):  
Gold Nanoparticles ◽  
Methyl Methacrylate ◽  
X Ray ◽  
Poly Methyl Methacrylate

Three-Dimensional Optical Bit Memory in Sm(DBM)3Phen-Doped and Un-Doped Poly(methyl methacrylate)

2011 ◽  
Vol 284-286 ◽  
pp. 2251-2254
Author(s):  
Zhao Gang Nie ◽  
Xin Zhong Li ◽  
Yu Ping Tai ◽  
Ki Soo Lim ◽  
Myeongkyu Lee
Keyword(s):  
Refractive Index ◽  
Methyl Methacrylate ◽  
Signal To Noise Ratio ◽  
Three Dimensional ◽  
Pulsed Laser ◽  
High Signal ◽  
Signal To Noise ◽  
Fluorescent Signal ◽  
Poly Methyl Methacrylate ◽  
Noise Ratio

The feasibility of three-dimensional optical bit memory is demonstrated by using the change of fluorescence and refractive index in Sm(DBM)3Phen-doped and un-doped Poly(methyl methacrylate). After a femtosecond pulsed laser irradiation, a refractive-index bit and a fluorescent bit can be formed at the same position inside the bulk sample. Multilayer patterns recorded by tightly focusing the pulsed laser beam were read out by a reflection-type fluorescent confocal microscope, which can detect the reflection signal and also the fluorescent signal of the stored bits. The signal-to-noise ratio via the two retrieval modes was compared as a function of recording depth. The stored bits were retrieved with a high signal-to-noise ratio in the absence of any crosstalk and the detection of the fluorescent signal enables retrieval of the stored bits with a higher S/N ratio.

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