scholarly journals Palirria: accurate on-line parallelism estimation for adaptive work-stealing

2015 ◽  
Vol 28 (2) ◽  
pp. 472-491 ◽  
Author(s):  
Georgios Varisteas ◽  
Mats Brorsson
Keyword(s):  
Work Stealing ◽  
On Line ◽  
Adaptive Work

Hardware/software support for adaptive work-stealing in on-chip multiprocessor

2010 ◽  
Vol 56 (8) ◽  
pp. 392-406 ◽  
Author(s):  
Quentin Meunier ◽  
Frédéric Pétrot ◽  
Jean-Louis Roch
Keyword(s):  
Chip Multiprocessor ◽  
Work Stealing ◽  
Software Support ◽  
On Chip ◽  
Adaptive Work

scholarly journals Stable Adaptive Work-Stealing for Concurrent Many-Core Runtime Systems

2012 ◽  
Vol E95.D (5) ◽  
pp. 1407-1416 ◽  
Author(s):  
Yangjie CAO ◽  
Hongyang SUN ◽  
Depei QIAN ◽  
Weiguo WU
Keyword(s):  
Runtime Systems ◽  
Work Stealing ◽  
Many Core ◽  
Adaptive Work

Adaptive work-stealing with parallelism feedback

2008 ◽  
Vol 26 (3) ◽  
pp. 1-32 ◽  
Author(s):  
Kunal Agrawal ◽  
Charles E. Leiserson ◽  
Yuxiong He ◽  
Wen Jing Hsu
Keyword(s):  
Work Stealing ◽  
Adaptive Work

scholarly journals Solving Large, Irregular Graph Problems Using Adaptive Work-Stealing

2008 ◽  
Author(s):  
Guojing Cong ◽  
Sreedhar Kodali ◽  
Sriram Krishnamoorthy ◽  
Doug Lea ◽  
Vijay Saraswat ◽  
...  
Keyword(s):  
Work Stealing ◽  
Graph Problems ◽  
Adaptive Work

On-line Scheduling of MPI-2 Programs with Hierarchical Work Stealing

2007 ◽  
Author(s):  
Guilherme P. Pezzi ◽  
Marcia C. Cera ◽  
Elton Mathias ◽  
Nicolas Maillard ◽  
Philippe O. A. Navaux
Keyword(s):  
Work Stealing ◽  
On Line

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

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