ChemInform Abstract: Quantitative SIMS Analysis of Hydroxyl Ion Content in Thin Oxide Films.

1986 ◽  
Vol 17 (39) ◽  
Author(s):  
D. F. MITCHELL ◽  
M. J. GRAHAM
Keyword(s):  
Oxide Films ◽  
Ion Content ◽  
Hydroxyl Ion ◽  
Thin Oxide Films ◽  
Sims Analysis ◽  
Thin Oxide ◽  
Quantitative Sims

Cover Picture: Photoinduced Formation of Wrinkled Microstructures with Long-Range Order in Thin Oxide Films (Adv. Mater. 24/2007)

2007 ◽  
Vol 19 (24) ◽  
pp. NA-NA
Author(s):  
M. Takahashi ◽  
T. Maeda ◽  
K. Uemura ◽  
J. Yao ◽  
Y. Tokuda ◽  
...  
Keyword(s):  
Long Range ◽  
Oxide Films ◽  
Range Order ◽  
Long Range Order ◽  
Thin Oxide Films ◽  
Thin Oxide
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