Atomic‐Scale Insights into Electrode Surface Dynamics by High‐Speed Scanning Probe Microscopy

2019 ◽  
Vol 25 (56) ◽  
pp. 12865-12883 ◽  
Author(s):  
Olaf M. Magnussen
Keyword(s):  
Scanning Probe Microscopy ◽  
Electrode Surface ◽  
High Speed ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Surface Dynamics ◽  
Probe Microscopy

Development of High-Speed Actuator for Scanning Probe Microscopy

2010 ◽  
pp. 45-54 ◽  
Author(s):  
Yasuhiro Sugawara ◽  
Yan Jun Li ◽  
Yoshitaka Naitoh ◽  
Masami Kageshima
Keyword(s):  
Scanning Probe Microscopy ◽  
High Speed ◽  
Scanning Probe ◽  
Probe Microscopy

A dual-stage nanopositioning approach to high-speed scanning probe microscopy

2012 ◽  
Author(s):  
Tomas Tuma ◽  
Walter Haeberle ◽  
Hugo Rothuizen ◽  
John Lygeros ◽  
Angeliki Pantazi ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
High Speed ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Dual Stage

Atomic Scale Imaging: A Hands-On Scanning Probe Microscopy Laboratory for Undergraduates

2003 ◽  
Vol 80 (2) ◽  
pp. 194 ◽  
Author(s):  
Chuan-Jian Zhong ◽  
Li Han ◽  
Mathew M. Maye ◽  
Jin Luo ◽  
Nancy N. Kariuki ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Hands On

High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories

2012 ◽  
Vol 23 (18) ◽  
pp. 185501 ◽  
Author(s):  
Tomas Tuma ◽  
John Lygeros ◽  
V Kartik ◽  
Abu Sebastian ◽  
Angeliki Pantazi
Keyword(s):  
Scanning Probe Microscopy ◽  
High Speed ◽  
Scanning Probe ◽  
Probe Microscopy

scholarly journals Response to “Comment on ‘MEMS-based high speed scanning probe microscopy’” [Rev. Sci. Instrum. 81, 117101 (2010)]

2010 ◽  
Vol 81 (11) ◽  
pp. 117102 ◽  
Author(s):  
E. C. M. Disseldorp ◽  
F. C. Tabak ◽  
A. J. Katan ◽  
M. B. S. Hesselberth ◽  
T. H. Oosterkamp ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
High Speed ◽  
Scanning Probe ◽  
Probe Microscopy

scholarly journals Pure hydrogen low-temperature plasma exposure of HOPG and graphene: Graphane formation?

2012 ◽  
Vol 3 ◽  
pp. 852-859 ◽  
Author(s):  
Baran Eren ◽  
Dorothée Hug ◽  
Laurent Marot ◽  
Rémy Pawlak ◽  
Marcin Kisiel ◽  
...  
Keyword(s):  
Low Temperature ◽  
Scanning Probe Microscopy ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Multilayer Graphene ◽  
Pure Hydrogen ◽  
Low Temperature Plasma ◽  
Temperature Plasma ◽  
Probe Microscopy

Single- and multilayer graphene and highly ordered pyrolytic graphite (HOPG) were exposed to a pure hydrogen low-temperature plasma (LTP). Characterizations include various experimental techniques such as photoelectron spectroscopy, Raman spectroscopy and scanning probe microscopy. Our photoemission measurement shows that hydrogen LTP exposed HOPG has a diamond-like valence-band structure, which suggests double-sided hydrogenation. With the scanning tunneling microscopy technique, various atomic-scale charge-density patterns were observed, which may be associated with different C–H conformers. Hydrogen-LTP-exposed graphene on SiO2 has a Raman spectrum in which the D peak to G peak ratio is over 4, associated with hydrogenation on both sides. A very low defect density was observed in the scanning probe microscopy measurements, which enables a reverse transformation to graphene. Hydrogen-LTP-exposed HOPG possesses a high thermal stability, and therefore, this transformation requires annealing at over 1000 °C.

scholarly journals Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy

2017 ◽  
Vol 88 (12) ◽  
pp. 123712 ◽  
Author(s):  
Maja Dukic ◽  
Vencislav Todorov ◽  
Santiago Andany ◽  
Adrian P. Nievergelt ◽  
Chen Yang ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Pid Controller ◽  
High Speed ◽  
Scanning Probe ◽  
Proportional Integral Derivative ◽  
Probe Microscopy ◽  
Proportional Integral ◽  
Digitally Controlled
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