Nearest neighbor difference rule-based kernel principal component analysis for fault detection in semiconductor manufacturing processes
2012 ◽
Vol 90
(9)
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pp. 1271-1280
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2009 ◽
Vol 42
(8)
◽
pp. 846-851
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2010 ◽
Vol 32
(11)
◽
pp. 3683-3691
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