scholarly journals Real-time Analysis of a Working Triethylaluminium-Modified Cr/Ti/SiO2Ethylene Polymerization Catalyst with In Situ Infrared Spectroscopy

ChemCatChem ◽  
2016 ◽  
Vol 8 (11) ◽  
pp. 1937-1944 ◽  
Author(s):  
Dimitrije Cicmil ◽  
Jurjen Meeuwissen ◽  
Aurélien Vantomme ◽  
Bert M. Weckhuysen
1991 ◽  
Vol 222 ◽  
Author(s):  
B. Johs ◽  
J. L. Edwards ◽  
K. T. Shiralagi ◽  
R. Droopad ◽  
K. Y. Choi ◽  
...  

ABSTRACTA modular spectroscopic ellipsometer, capable of both in-situ and ex-situ operation, has been used to measure important growth parameters of GaAs/AIGaAs structures. The ex-situ measurements provided layer thicknesses and compositions of the grown structures. In-situ ellipsometric measurements allowed the determination of growth rates, layer thicknesses, and high temperature optical constants. By performing a regression analysis of the in-situ data in real-time, the thickness and composition of an AIGaAs layer were extracted during the MBE growth of the structure.


2008 ◽  
Vol 39 (4) ◽  
pp. 865-874 ◽  
Author(s):  
G. Reinhart ◽  
A. Buffet ◽  
H. Nguyen-Thi ◽  
B. Billia ◽  
H. Jung ◽  
...  

2008 ◽  
Vol 310 (11) ◽  
pp. 2906-2914 ◽  
Author(s):  
H. Nguyen Thi ◽  
G. Reinhart ◽  
A. Buffet ◽  
T. Schenk ◽  
N. Mangelinck-Noël ◽  
...  

1996 ◽  
Vol 68 (24) ◽  
pp. 3386-3388 ◽  
Author(s):  
Y. Vickie Pan ◽  
Ernesto Z. Barrios ◽  
Denice D. Denton

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