Influence of novel X‐ray imaging technology on radiation exposure during chronic total occlusion procedures

2018 ◽  
Vol 92 (7) ◽  
pp. 1268-1273 ◽  
Author(s):  
Tilmann Busse ◽  
Joerg Reifart ◽  
Nicolaus Reifart
Keyword(s):  
Radiation Exposure ◽  
Chronic Total Occlusion ◽  
Total Occlusion ◽  
Imaging Technology ◽  
X Ray ◽  
X Ray Imaging

scholarly journals TCT-147 Patient radiation exposure with a novel X-ray imaging technology during coronary angiography and angioplasty

2014 ◽  
Vol 64 (11) ◽  
pp. B44 ◽  
Author(s):  
Fernando Cura ◽  
Bonvini Victor ◽  
Pablo Lamelas ◽  
Gustavo O. Pedernera ◽  
Pablo Spaletra ◽  
...  
Keyword(s):  
Coronary Angiography ◽  
Radiation Exposure ◽  
Imaging Technology ◽  
X Ray ◽  
X Ray Imaging ◽  
Patient Radiation Exposure

Three Dimensional X-Ray Computed Tomography in Materials Science

MRS Bulletin ◽  
1988 ◽  
Vol 13 (1) ◽  
pp. 13-18 ◽  
Author(s):  
J.H. Kinney ◽  
Q.C. Johnson ◽  
U. Bonse ◽  
M.C. Nichols ◽  
R.A. Saroyan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Sample Preparation ◽  
Visible Light ◽  
Three Dimensional ◽  
Materials Characterization ◽  
Imaging Technology ◽  
X Ray ◽  
X Ray Imaging ◽  
Visible Light Imaging

Imaging is the cornerstone of materials characterization. Until the middle of the present century, visible light imaging provided much of the information about materials. Though visible light imaging still plays an extremely important role in characterization, relatively low spatial resolution and lack of chemical sensitivity and specificity limit its usefulness.The discovery of x-rays and electrons led to a major advance in imaging technology. X-ray diffraction and electron microscopy allowed us to characterize the atomic structure of materials. Many materials vital to our high technology economy and defense owe their existence to the understanding of materials structure brought about with these high-resolution methods.Electron microscopy is an essential tool for materials characterization. Unfortunately, electron imaging is always destructive due to the sample preparation that must be done prior to imaging. Furthermore, electron microscopy only provides information about the surface of a sample. Three dimensional information, of great interest in characterizing many new materials, can be obtained only by time consuming sectioning of an object.The development of intense synchrotron light sources in addition to the improvements in solid state imaging technology is revolutionizing materials characterization. High resolution x-ray imaging is a potentially valuable tool for materials characterization. The large depth of x-ray penetration, as well as the sensitivity of absorption crosssections to atomic chemistry, allows x-ray imaging to characterize the chemistry of internal structures in macroscopic objects with little sample preparation. X-ray imaging complements other imaging modalities, such as electron microscopy, in that it can be performed nondestructively on metals and insulators alike.

scholarly journals Synchrotron Radiation Nanoscale X-ray Imaging Technology And Scientific Big Data Mining Assist Energy Materials Research

2018 ◽  
Vol 24 (S2) ◽  
pp. 542-543
Author(s):  
Kai zhang ◽  
Fang Ren ◽  
Xuelong Wang ◽  
Enyuan Hu ◽  
Xiao-Qing Yang ◽  
...  
Keyword(s):  
Data Mining ◽  
Big Data ◽  
Synchrotron Radiation ◽  
Energy Materials ◽  
Imaging Technology ◽  
X Ray ◽  
Big Data Mining ◽  
X Ray Imaging ◽  
Materials Research

scholarly journals Coherent X-ray imaging technology

2020 ◽  
Vol 50 (11) ◽  
pp. 1213-1221
Author(s):  
YuHan BIAN ◽  
Peng XI ◽  
RuoNan WU
Keyword(s):  
Imaging Technology ◽  
X Ray ◽  
X Ray Imaging
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